Current measurement systems depend more and more on mathematical and computational approaches. Novel developments include virtual metrology digital twins, sensor networks, uncertainty quantification of computationally expensive models and artificial intelligence. Altogether, metrology has started to move from consideration of individual devices to more systemic approaches, which are needed to cope with measurement challenges in climate and pollution monitoring, digital health and the factory of the future. Also optimization, inverse problems and sampling methods play a more important role than in the past. This book will start with introducing the basic principles and classical statistical and mathematical models employed in metrology and expand from there, addressing the novel developments mentioned above. This will be done from the perspective of metrology whereby both theoretical and practical aspects are carefully addressed by experts from the field.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
João A. Sousa, IPG, Portugal; Alistair B. Forbes, NPL, UK; Gertjan Kok, VSL, Netherlands; Markus Bär, PTB, Germany.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Buch. Etat : Neu. Neuware - Current measurement systems depend more and more on mathematical and computational approaches. Novel developments include virtual metrology digital twins, sensor networks, uncertainty quantification of computationally expensive models and artificial intelligence. Altogether, metrology has started to move from consideration of individual devices to more systemic approaches, which are needed to cope with measurement challenges in climate and pollution monitoring, digital health and the factory of the future. Also optimization, inverse problems and sampling methods play a more important role than in the past. This book will start with introducing the basic principles and classical statistical and mathematical models employed in metrology and expand from there, addressing the novel developments mentioned above. This will be done from the perspective of metrology whereby both theoretical and practical aspects are carefully addressed by experts from the field. N° de réf. du vendeur 9783111536033
Quantité disponible : 2 disponible(s)
Vendeur : moluna, Greven, Allemagne
Etat : New. N° de réf. du vendeur 1842635124
Quantité disponible : Plus de 20 disponibles
Vendeur : Revaluation Books, Exeter, Royaume-Uni
Hardcover. Etat : Brand New. 250 pages. 6.69x2.00x9.45 inches. In Stock. N° de réf. du vendeur __3111536033
Quantité disponible : 2 disponible(s)
Vendeur : preigu, Osnabrück, Allemagne
Buch. Etat : Neu. Mathematical and Computational Approaches in Metrology | João A. Sousa (u. a.) | Buch | X | Englisch | 2026 | De Gruyter | EAN 9783111536033 | Verantwortliche Person für die EU: Walter de Gruyter GmbH, De Gruyter GmbH, Genthiner Str. 13, 10785 Berlin, productsafety[at]degruyterbrill[dot]com | Anbieter: preigu. N° de réf. du vendeur 138116399
Quantité disponible : 5 disponible(s)
Vendeur : Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlande
Etat : New. 2026. 1st Edition. hardcover. . . . . . N° de réf. du vendeur V9783111536033
Quantité disponible : Plus de 20 disponibles
Vendeur : Kennys Bookstore, Olney, MD, Etats-Unis
Etat : New. 2026. 1st Edition. hardcover. . . . . . Books ship from the US and Ireland. N° de réf. du vendeur V9783111536033
Quantité disponible : Plus de 20 disponibles