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Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance - Couverture souple

Van Schooten, Kipp

 
9783319033280: Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance

Synopsis

This book lays the groundwork for further use of Electron Spin Echo Envelop Modulation (ESEEM) and opens the possibility of highly precise chemical fingerprinting. It reveals an astonishingly long memory of spin coherence in semiconductor particles.

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À propos de l'auteur

Kipp van Schooten
Department of Physics and Astronomy
University of Utah
Salt Lake City, UT, 84112
USA

Kipp van Schooten received his Ph.D. in Physics (Condensed Matter focus) from the University of Utah in December 2012. He received the Outstanding Teaching Assistant award each year from 2005 - 2009 for the courses "Intro to Quantum Relativity" and "Solid State Physics II." In 2011, he also received first place for Best Graduate Student Oral Presentation at the University of Utah.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Autres éditions populaires du même titre

9783319005898: Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance

Edition présentée

ISBN 10 :  3319005898 ISBN 13 :  9783319005898
Editeur : Springer International Publishin..., 2013
Couverture rigide