Noncontact Atomic Force Microscopy: Volume 3 - Couverture souple

9783319358765: Noncontact Atomic Force Microscopy: Volume 3

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ISBN 10 : 3319358766 ISBN 13 : 9783319358765

Editeur : Springer International Publishing AG, 2016

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Introduction.- 3D Force-Field Spectroscopy.- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts.- Spectroscopy and Manipulation Using AFM/STM at Room Temperature.- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy.- Non-Contact Friction.- Magnetic Exchange Force Spectroscopy.- Revealing Subsurface Vibrational Modes by Atom-Resolved Damping Force Spectroscopy.- Interaction and Self-Assembly of Organic Molecules on Insulating Surfaces.- NC-AFM Experiments on Molecular Systems.- Single-Molecule Force Spectroscopy.- Submolecular Resolution and Tip Functionalization.- Mapping the Force-Fields of Intra- and Intermolecular Bonds.- Single-Molecule Force-Sensor Assisted Scanning Tunneling Microscopy.- Nanostructured Surfaces of Doped Alkali Halides.- The Atomic Structure of Two-Dimensional Silica.- NC-AFM Imaging of Molecules at Surfaces of Bulk Insulators.- Simulating NC-AFM of Complex Systems.- Recent Progress in Frequency Modulation Atomic Force Microscopy in Liquids.- Subnanometer-Resolution FM-AFM Imaging at Solid/Liquid Interfaces.- High Spatial-Resolution AFM Studies of Electrochemical Interfaces.- High-Speed Atomic Force Microscopic Observation of Motor Proteins.

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�diteur: Springer International Publishing AG
Date d'�dition: 2016
Langue: anglais
ISBN 10: 3319358766
ISBN 13: 9783319358765
Reliure: Broch�
Nombre de pages: 549
�diteur: Morita Seizo, Giessibl Franz J., Meyer Ernst, Wiesendanger Roland
Coordonn�es du fabricant: ProductSafety@springernature.com
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Morita, Seizo

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Noncontact Atomic Force Microscopy

Morita, Seizo|Giessibl, Franz J.|Meyer, Ernst|Wiesendanger, Roland

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Noncontact Atomic Force Microscopy

Seizo Morita

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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology. 552 pp. Englisch. N� de r�f. du vendeur 9783319358765

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Noncontact Atomic Force Microscopy : Volume 3

Morita, Seizo (EDT); Giessibl, Franz J. (EDT); Meyer, Ernst (EDT); Wiesendanger, Roland (EDT)

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Noncontact Atomic Force Microscopy : Volume 3

Morita, Seizo (EDT); Giessibl, Franz J. (EDT); Meyer, Ernst (EDT); Wiesendanger, Roland (EDT)

Edit� par Springer, 2016

ISBN 10 : 3319358766 ISBN 13 : 9783319358765

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Noncontact Atomic Force Microscopy | Volume 3

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Noncontact Atomic Force Microscopy

Seizo Morita

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Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 552 pp. Englisch. N� de r�f. du vendeur 9783319358765

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Noncontact Atomic Force Microscopy : Volume 3

Seizo Morita

Edit� par Springer International Publishing, 2016

ISBN 10 : 3319358766 ISBN 13 : 9783319358765

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Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology. N� de r�f. du vendeur 9783319358765

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