Vlsi-soc: Design for Reliability, Security, and Low Power: 23rd Ifip Wg 10.5/Ieee International Conference on Very Large Scale Integration, Vlsi-soc ... October 5-7, 2015, Revised Selected Papers - Couverture rigide

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9783319460963: Vlsi-soc: Design for Reliability, Security, and Low Power: 23rd Ifip Wg 10.5/Ieee International Conference on Very Large Scale Integration, Vlsi-soc ... October 5-7, 2015, Revised Selected Papers

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ISBN 10 : 331946096X ISBN 13 : 9783319460963

Editeur : Springer International Publishing AG, 2016

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This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.

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�diteur: Springer International Publishing AG
Date d'�dition: 2016
Langue: anglais
ISBN 10: 331946096X
ISBN 13: 9783319460963
Reliure: Reli�
Num�ro d'�dition: 1
Nombre de pages: 236
�diteur: Shin Youngsoo, Tsui Chi Ying, Kim Jae-Joon, Choi Kiyoung, Reis Ricardo
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VLSI-SoC: Design for Reliability, Security, and Low Power

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Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems. 240 pp. Englisch. N� de r�f. du vendeur 9783319460963

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VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC . in Information and Communication Technology)

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VLSI-SoC: Design for Reliability, Security, and Low Power

Shin, Youngsoo|Tsui, Chi Ying|Kim, Jae-Joon|Choi, Kiyoung|Reis, Ricardo

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Gebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book . N� de r�f. du vendeur 128556523

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VLSI-SoC: Design for Reliability, Security, and Low Power

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Edit� par Springer International Publishing, Springer International Publishing Sep 2016, 2016

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Buch. Etat : Neu. Neuware -This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 240 pp. Englisch. N� de r�f. du vendeur 9783319460963

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VLSI-SoC: Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers

Youngsoo Shin

Edit� par Springer International Publishing, 2016

ISBN 10 : 331946096X ISBN 13 : 9783319460963

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Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems. N� de r�f. du vendeur 9783319460963

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VLSI-SoC: Design for Reliability, Security, and Low Power | 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers

Youngsoo Shin (u. a.)

Edit� par Springer, 2016

ISBN 10 : 331946096X ISBN 13 : 9783319460963

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Buch. Etat : Neu. VLSI-SoC: Design for Reliability, Security, and Low Power | 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers | Youngsoo Shin (u. a.) | Buch | xiii | Englisch | 2016 | Springer | EAN 9783319460963 | Verantwortliche Person f�r die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. N� de r�f. du vendeur 103481098

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VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC . and Communication Technology, 483)

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