Spectroscopic Ellipsometry for Photovoltaics: Fundamental Principles and Solar Cell Characterization - Couverture rigide

Couverture rigide

ISBN 10 : 3319753754 ISBN 13 : 9783319753751

Editeur : Springer International Publishing AG, 2019

Synopsis

Presents ellipsometry characterization of solar cell materials/devices

Provides easy-to-understand explanations of ellipsometry data analysis

Includes optical constants for all solar-cell component layers

A propos du livre

À propos de l?auteur

Hiroyuki Fujiwara received the Ph.D. degree from Tokyo Institute of Technology. He was a research associate at The Pennsylvania State University. In 1998, he joined Electrotechnical laboratory, Ministry of International Trade and Industry, Japan. Later in 2007, he became a team leader of Research Center for Photovoltaics, National Institute of Advanced Industrial Science and Technology (AIST) in Japan. He is currently a professor in the Department of Electrical, Electronic and Computer Engineering, Gifu University.

Robert W. Collins received the Ph.D. degree from Harvard University. He worked at BP America/Standard Oil Co. In 1992, he became a professor of Physics and Materials Research at The Pennsylvania State University. He is currently a Distinguished University Professor and NEG Endowed Chair of Silicate and Materials Science with the Department of Physics and Astronomy, University of Toledo. He co-directs the Center for Photovoltaics Innovation and Commercialization.

Détails de l'édition

• Éditeur: Springer International Publishing AG
• Date d'édition: 2019
• Langue: anglais
• ISBN 10: 3319753754
• ISBN 13: 9783319753751
• Reliure: Relié
• Nombre de pages: 614
• Éditeur: Fujiwara Hiroyuki, Collins Robert W.
• Coordonnées du fabricant: ProductSafety@springernature.com; ProductSafety@springernature.com; ; Poststr. 9; Darmstadt; 64293; Allemagne