This work is aimed towards the implementation of a fault-tolerant memory system with the help of supporting circuits. This work demonstrates an improvement on the reliability of a semiconductor memory system using Error control codes (ECC)and Low Density Parity Check (LDPC) Codes as a part of protecting support logic. It is observed that the error correcting codes with higher hamming distances can detect more errors i.e. as higher the hamming distance higher the error control capability.
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Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This work is aimed towards the implementation of a fault-tolerant memory system with the help of supporting circuits. This work demonstrates an improvement on the reliability of a semiconductor memory system using Error control codes (ECC)and Low Density Parity Check (LDPC) Codes as a part of protecting support logic. It is observed that the error correcting codes with higher hamming distances can detect more errors i.e. as higher the hamming distance higher the error control capability. 128 pp. Englisch. N° de réf. du vendeur 9783330044197
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: S. Murti Sarma N.Asst.Prof.Poluboyina Lavanya and Assoc.Prof.Gobinda Prasad Acharya are upgrowing research scholars of JNTUK and JNTUH in the areas of wireless networks and VLSI testing respectively. N S Murti Sarma together with abo. N° de réf. du vendeur 158590434
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Vendeur : Revaluation Books, Exeter, Royaume-Uni
Paperback. Etat : Brand New. 128 pages. 8.66x5.91x0.29 inches. In Stock. N° de réf. du vendeur 3330044195
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Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -This work is aimed towards the implementation of a fault-tolerant memory system with the help of supporting circuits. This work demonstrates an improvement on the reliability of a semiconductor memory system using Error control codes (ECC)and Low Density Parity Check (LDPC) Codes as a part of protecting support logic. It is observed that the error correcting codes with higher hamming distances can detect more errors i.e. as higher the hamming distance higher the error control capability.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 128 pp. Englisch. N° de réf. du vendeur 9783330044197
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Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Taschenbuch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This work is aimed towards the implementation of a fault-tolerant memory system with the help of supporting circuits. This work demonstrates an improvement on the reliability of a semiconductor memory system using Error control codes (ECC)and Low Density Parity Check (LDPC) Codes as a part of protecting support logic. It is observed that the error correcting codes with higher hamming distances can detect more errors i.e. as higher the hamming distance higher the error control capability. N° de réf. du vendeur 9783330044197
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Vendeur : preigu, Osnabrück, Allemagne
Taschenbuch. Etat : Neu. Realization of Memory Fault Tolerance using Error Correcting Codes | N. S. Murti Sarma (u. a.) | Taschenbuch | 128 S. | Englisch | 2017 | LAP LAMBERT Academic Publishing | EAN 9783330044197 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu Print on Demand. N° de réf. du vendeur 108505592
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