European Powder Diffraction Conference; August 2010, Darmstadt, Germany - Couverture rigide

$9783486989403: European Powder Diffraction Conference; August 2010, Darmstadt, Germany$

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ISBN 10 : 3486989405 ISBN 13 : 9783486989403

Editeur : De Gruyter Oldenbourg, 2013

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�diteur: De Gruyter Oldenbourg
Date d'�dition: 2013
Langue: anglais
ISBN 10: 3486989405
ISBN 13: 9783486989403
Reliure: Reli�
Nombre de pages: 560
�diteur: Oldenbourg
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European Powder Diffraction Conference; August 2010, Darmstadt, Germany

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Edit� par De Gruyter Oldenbourg Nov 2013, 2013

ISBN 10 : 3486989405 ISBN 13 : 9783486989403

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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Frontmatter -- PREFACE -- Editorial Notes -- European Powder Diffraction Conference Award for Young Scientists -- European Powder Diffraction Conference Award for Distinguished Powder Diffractionists -- Table of Contents -- I. METHOD DEVELOPMENT AND APPLICATION -- I.1 Determination of Crystal Structure -- Complementarities between precession electron and X-ray powder diffraction -- Differential Pair Distribution Function applied to Ce1-xGdxO2-x/2 system -- I.2 Qualitative and Quantitative Phase Analysis -- A suitable method for quantitative phase analysis of samples with high amorphous content -- UMo/Al nuclear fuel quantitative analysis via high energy X-ray diffraction -- I.3 Microstructure and Line Broadening Analysis -- Microstrain in nanocrystalline samples from atomistic simulation -- Simulating the temperature effect in a powder diffraction pattern with molecular dynamics -- A new combined approach to investigate stacking faults in lamellar compounds -- Factors affecting diffraction broadening analysis -- Crystallite size evolution in hydrothermal formation of kaolinite -- Particle statistics in synchrotron powder diffractometry -- High energy milling of Cu2O powders -- Defects in nanocrystalline ceria xerogel -- Determination of crystallite size distribution histogram in nanocrystalline anatase powders by XRD -- Crystal growth mechanism of kaolinites deduced from crystallite size distribution -- Diffraction peak broadening of energetic materials -- Calculation of a line profile for the diffractometer with a primary monochromator -- I.4 Texture -- Characterization of weakly deformed limestone from Chotec, Bohemia by neutron transmission -- Multiple scattering from textured polycrystals -- II. INSTRUMENTAL -- Powgen: A third-generation highresolution high-throughput powder diffraction instrument at the Spallation Neutron Source -- Technical concept of the materials science beamline at ALBA -- Instrumental calibration of laboratory X-ray powder diffractometers -- New anti-air-scatter screen for powder XRD with linear position sensitive detectors -- In-situ XRPD of hydrating cement with lab instrument: reflection vs. transmission measurements -- In-house characterization of protein powder -- Multiple reflections accompanying allowed and forbidden single reflections in bent Si-crystals -- 2th-scanning 2D-area detector for high quality powder data collection using synchrotron radiation -- III. SOFTWARE -- Adaption of a Rietveld code towards clay structure description -- Real-space powder diffraction computing on clusters of Graphics Processing Units -- Evaluation of algorithms and weighting methods for MEM analysis from powder diffraction data -- YAYLA, a program for handling area detector data of glasses -- IV. MATERIALS -- IV.1 Thin Layers -- HTXRD study of atomic layer deposited noble metal thin films heat treated in oxygen -- XRD real structure characterization of sputtered Au films different in thickness -- Liquid-phase self-terminated growth of MOF thin films: An X-ray diffraction study -- IV.2 Nanocrystalline and Amorphous Materials -- X-ray study of structure of the TiO2 nanotubes and nanowires -- Core-Shell structure of nanocrystalline AlN in real and reciprocal spaces -- Compression and thermal expansion of nanocrystalline TiN -- Diffraction analysis of grain growth in nanocrystalline Ni-W powders prepared by mechanical milling -- Orientational degeneracy of antiferromagnetic exchange striction in anisotropic ultrafine NiO nanocrystals -- IV.3 Metals and Alloys -- IV.3.1 General -- X-ray diffraction analysis of phases in weldments of super duplex stainless steels -- X-ray studies of martensitic transformation in Fe-Ni alloys rapidly quenched from the melt -- Gamma- -Gamma-martensitic transitions influence on the martensite decomposition of quenched steel -- IV.3.2 Microstructure, Stress and Texture -- Strain relaxation and grain growth in 316LVM stainless steel annealed under pressure -- Influence of elastic stress 556 pp. Englisch. N� de r�f. du vendeur 9783486989403

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European Powder Diffraction Conference August 2010, Darmstadt, Germany

Edit� par De Gruyter Oldenbourg, 2013

ISBN 10 : 3486989405 ISBN 13 : 9783486989403

Oldenbourg

Edit� par De Gruyter Oldenbourg Nov 2013, 2013

ISBN 10 : 3486989405 ISBN 13 : 9783486989403

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Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -No detailed description available for 'European Powder Diffraction Conference; August 2010, Darmstadt, Germany'.De Gruyter Oldenbourg, Genthiner Stra�e 13, 10785 Berlin 556 pp. Englisch. N� de r�f. du vendeur 9783486989403

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European Powder Diffraction Conference; August 2010, Darmstadt, Germany

Oldenbourg

Edit� par De Gruyter Oldenbourg, 2013

ISBN 10 : 3486989405 ISBN 13 : 9783486989403

Neuf Taschenbuch

Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne

�valuation du vendeur 5 sur 5 �toiles

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Frontmatter -- PREFACE -- Editorial Notes -- European Powder Diffraction Conference Award for Young Scientists -- European Powder Diffraction Conference Award for Distinguished Powder Diffractionists -- Table of Contents -- I. METHOD DEVELOPMENT AND APPLICATION -- I.1 Determination of Crystal Structure -- Complementarities between precession electron and X-ray powder diffraction -- Differential Pair Distribution Function applied to Ce1-xGdxO2-x/2 system -- I.2 Qualitative and Quantitative Phase Analysis -- A suitable method for quantitative phase analysis of samples with high amorphous content -- UMo/Al nuclear fuel quantitative analysis via high energy X-ray diffraction -- I.3 Microstructure and Line Broadening Analysis -- Microstrain in nanocrystalline samples from atomistic simulation -- Simulating the temperature effect in a powder diffraction pattern with molecular dynamics -- A new combined approach to investigate stacking faults in lamellar compounds -- Factors affecting diffraction broadening analysis -- Crystallite size evolution in hydrothermal formation of kaolinite -- Particle statistics in synchrotron powder diffractometry -- High energy milling of Cu2O powders -- Defects in nanocrystalline ceria xerogel -- Determination of crystallite size distribution histogram in nanocrystalline anatase powders by XRD -- Crystal growth mechanism of kaolinites deduced from crystallite size distribution -- Diffraction peak broadening of energetic materials -- Calculation of a line profile for the diffractometer with a primary monochromator -- I.4 Texture -- Characterization of weakly deformed limestone from Chotec, Bohemia by neutron transmission -- Multiple scattering from textured polycrystals -- II. INSTRUMENTAL -- Powgen: A third-generation highresolution high-throughput powder diffraction instrument at the Spallation Neutron Source -- Technical concept of the materials science beamline at ALBA -- Instrumental calibration of laboratory X-ray powder diffractometers -- New anti-air-scatter screen for powder XRD with linear position sensitive detectors -- In-situ XRPD of hydrating cement with lab instrument: reflection vs. transmission measurements -- In-house characterization of protein powder -- Multiple reflections accompanying allowed and forbidden single reflections in bent Si-crystals -- 2th-scanning 2D-area detector for high quality powder data collection using synchrotron radiation -- III. SOFTWARE -- Adaption of a Rietveld code towards clay structure description -- Real-space powder diffraction computing on clusters of Graphics Processing Units -- Evaluation of algorithms and weighting methods for MEM analysis from powder diffraction data -- YAYLA, a program for handling area detector data of glasses -- IV. MATERIALS -- IV.1 Thin Layers -- HTXRD study of atomic layer deposited noble metal thin films heat treated in oxygen -- XRD real structure characterization of sputtered Au films different in thickness -- Liquid-phase self-terminated growth of MOF thin films: An X-ray diffraction study -- IV.2 Nanocrystalline and Amorphous Materials -- X-ray study of structure of the TiO2 nanotubes and nanowires -- Core-Shell structure of nanocrystalline AlN in real and reciprocal spaces -- Compression and thermal expansion of nanocrystalline TiN -- Diffraction analysis of grain growth in nanocrystalline Ni-W powders prepared by mechanical milling -- Orientational degeneracy of antiferromagnetic exchange striction in anisotropic ultrafine NiO nanocrystals -- IV.3 Metals and Alloys -- IV.3.1 General -- X-ray diffraction analysis of phases in weldments of super duplex stainless steels -- X-ray studies of martensitic transformation in Fe-Ni alloys rapidly quenched from the melt -- Gamma- -Gamma-martensitic transitions influence on the martensite decomposition of quenched steel -- IV.3.2 Microstructure, Stress and Texture -- Strain relaxation and grain growth in 316LVM stainless steel annealed under pressure -- Influence of elastic stress. N� de r�f. du vendeur 9783486989403

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