Scanning Tunneling Microscopy and Spectroscopy: Theory, Techniques and Applications - Couverture rigide

Couverture rigide

ISBN 10 : 3527279202 ISBN 13 : 9783527279203

Editeur : Wiley-VCH Verlag GmbH, 1993

Synopsis

In the decade since its inventions, the scanning tunneling microscope (STM) has had a dramatic impact in a wide range of fields, including materials science, semiconductor physics, biology, electro-chemistry. Scanning tunneling microscopy provides three-dimensional, real-space images of surfaces at high spatial resolution; when the sample is clean and flat, even atoms can be imaged. The extreme usefulness of STM helps explain its nearly instantaneous acceptance as a characterization tool. Indeed, scanning tunneling microscopy carries electron tunneling one step further. This handbook is addressed to the large community of STM users that has developed in recent years as several companies have successfully commercialized STM systems. The book should interest material scientists, electrochemists, physical chemists, both in academic and industrial settings. More specifically, the book should interest purchasers commercial STMs; people who attend the numerous STM shortcourses offered by several technical societies; surface scientists modifying their equipment to include STM capabilities, sutdents in characterization sources of university materials science programs; research administrators considering adding STM systems to their labs and technicians in materials labs.

A propos du livre

Présentation de l'éditeur

Scanning tunneling microscopy (STM) provides three–dimensional real– space images of surfaces at high spatial resolution. When the surface is flat and clean, even atoms can be imaged. Its extreme usefulness has led it to near instantaneous acceptance as a characterization tool.

This book covers fundamental concepts of STM operation, image interpretation, instrumentation, and techniques for various applications. It als contains advanced treatments of theory and spectroscopy.
Surface physicists, electrochemists, materials scientists, and other scientists who see a use for STM will find the depth of coverage and accompanying reference lists in this book essential to their work. In addition, those who wish to add the capabilities of probe microscopy to their operations, such as microscopists and quality control engineers, will find the basic information in this book.

Détails de l'édition

• Éditeur: Wiley-VCH Verlag GmbH
• Date d'édition: 1993
• ISBN 10: 3527279202
• ISBN 13: 9783527279203
• Reliure: Relié
• Langue: anglais
• Nombre de pages: 450
• Éditeur: Bonnell D. A., Ross Phil N.
• Coordonnées du fabricant: non disponible