Nanoscale Characterization of Surfaces and Interfaces - Couverture rigide

Dinardo, John N.

Couverture rigide

ISBN 10 : 3527292470 ISBN 13 : 9783527292479

Editeur : Wiley-VCH Verlag GmbH, 1994

Synopsis

Designed for solid state physicists and chemists, applied physicists and surface chemists, this text covers nanoscale characterization of surfaces and interfaces. Derived from the series, "Materials Science and Technology", it provides coverage of STM, AFM and related non-contact nanoscale probes, along with details applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the techniques, and many high-quality images demonstrate the power of these methods in the investigation of surfaces and the processes which occur on them. Topics covered include: scanning tunnelling microscopy; atomic force microscopy; semiconductor surfaces and interfaces; superconductors; electrochemistry at liquid-solid interfaces; biological systems; metrological applications; nanotribology; and manipulation on the nanoscale.

Détails de l'édition

• Éditeur: Wiley-VCH Verlag GmbH
• Date d'édition: 1994
• Langue: anglais
• ISBN 10: 3527292470
• ISBN 13: 9783527292479
• Reliure: Relié
• Nombre de pages: 173
• Coordonnées du fabricant: non disponible
• Personne responsable: non disponible