Electron Microscopy: Principles and Fundamentals - Couverture rigide

 
9783527294794: Electron Microscopy: Principles and Fundamentals
Couverture rigide
ISBN 10 : 3527294791 ISBN 13 : 9783527294794
Editeur : Wiley-VCH Verlag GmbH, 1997

Synopsis

Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Quatrième de couverture

Electron Microscopy Principles and Fundamentals Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Derived from the successful three–volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include:

  • Stationary Beam Methods: Transmission Electron Microscoy/Electron Energy Loss Spectroscopy/Convergent Electron Beam Diffraction/Low Energy Electron Microscopy/Electron Holographic Methods
  • Scanning Beam Methods: Scanning Transmission Electron Microscopy/Scanning Auger and XPS Microscopy/Scanning Microanalysis/Imaging Secondary Ion Mass Spectrometry
  • Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/Spin Polarized Low Energy Electron Microscopy
Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.

Présentation de l'éditeur

Derived from the successful three–volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research.

Topics include:
∗ Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods
∗ Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry
∗ Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy

Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Wiley-VCH Verlag GmbH
Date d'édition
1997
Langue
anglais
ISBN 10 
3527294791
ISBN 13 
9783527294794
Reliure
Relié
Nombre de pages
527
Éditeur
Amelinckx S.
Coordonnées du fabricant
non disponible
Personne responsable
non disponible