Articles liés à Electron Microscopy: Principles and Fundamentals
Synopsis
Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Quatrième de couverture
Electron Microscopy Principles and Fundamentals Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Derived from the successful three–volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include:
- Stationary Beam Methods: Transmission Electron Microscoy/Electron Energy Loss Spectroscopy/Convergent Electron Beam Diffraction/Low Energy Electron Microscopy/Electron Holographic Methods
- Scanning Beam Methods: Scanning Transmission Electron Microscopy/Scanning Auger and XPS Microscopy/Scanning Microanalysis/Imaging Secondary Ion Mass Spectrometry
- Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/Spin Polarized Low Energy Electron Microscopy
Présentation de l'éditeur
Derived from the successful three–volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research.
Topics include:
∗ Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods
∗ Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry
∗ Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy
Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
- ÉditeurWiley-VCH Verlag GmbH
- Date d'édition1997
- ISBN 10 3527294791
- ISBN 13 9783527294794
- ReliureRelié
- Langueanglais
- Nombre de pages527
- ÉditeurAmelinckx S.
- Coordonnées du fabricantnon disponible
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Electron Microscopy : Principles and Fundamentals
Edité par
WILEY-VCH Verlag GmbH, 1997
ISBN 10 : 3527294791
ISBN 13 : 9783527294794
Ancien ou d'occasion
Couverture rigide
Vendeur : Buchpark, Trebbin, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Etat : Sehr gut. Zustand: Sehr gut | Seiten: 560 | Sprache: Englisch | Produktart: Bücher. N° de réf. du vendeur 253534/202
Quantité disponible : 1 disponible(s)
Image d'archives
Electron Microscopy : Principles and Fundamentals
Edité par
WILEY-VCH Verlag GmbH, 1997
ISBN 10 : 3527294791
ISBN 13 : 9783527294794
Ancien ou d'occasion
Couverture rigide
Vendeur : Buchpark, Trebbin, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Etat : Gut. Zustand: Gut | Seiten: 560 | Sprache: Englisch | Produktart: Bücher. N° de réf. du vendeur 253534/203
Quantité disponible : 1 disponible(s)
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Electron Microscopy: Principles and Fundamentals
Edité par
Wiley-VCH Publishing, 1997
ISBN 10 : 3527294791
ISBN 13 : 9783527294794
Ancien ou d'occasion
Couverture rigide
Vendeur : Salish Sea Books, Bellingham, WA, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : Good. Good+; Hardcover; Withdrawn library copy with the standard library markings; Light wear to the covers; Library stamps to the endpapers; Text pages are clean & unmarked; Binding is excellent with a straight spine; This book will be shipped in a sturdy cardboard box with foam padding; Medium Format (8.5" - 9.75" tall); White and blue covers with title in black lettering; 1997, Wiley-VCH Publishing; 527 pages; "Electron Microscopy: Principles and Fundamentals," by Edited by: S. Amelinckx. N° de réf. du vendeur SKU-105BC01010171
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Electron Microscopy: Principles and Fundamentals
Vendeur : Toscana Books, AUSTIN, TX, Etats-Unis
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Hardcover. Etat : new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks. N° de réf. du vendeur Scanned3527294791
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