Surface and Thin Film Analysis : Compendium of Principles, Instrumentation and Applications - Couverture rigide

Bubert, H

 
9783527304585: Surface and Thin Film Analysis : Compendium of Principles, Instrumentation and Applications
Couverture rigide
ISBN 10 : 3527304584 ISBN 13 : 9783527304585
Editeur : Wiley-VCH Verlag GmbH, 2002

Synopsis

The development and quality assurance of such high-tech materials as semiconductors or biopolymers demand special analytical methods for surfaces and thin films. This book presents the whole spectrum of methods available in a clear manner, moving beyond the basics, equipment and applications to compare these methods. This allows users to find the optimum method in solving any given problem. The book is richly illustrated with 200 figures. It includes almost 900 references that guide to the primary literature; and a list of suppliers, each with full address, that makes it easy to obtain the required equipment.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano– and surface technology. This new book has been revised and updated and is divided into four parts – electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.

From a Review of the First Edition (edited by Bubert and Jenett)
"... a useful resource..."
(Journal of the American Chemical Society)

Revue de presse

"...a useful resource..." ( Journal of the American Chemical Society, Vol. 125, No.26, 2003)

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Wiley-VCH Verlag GmbH
Date d'édition
2002
Langue
anglais
ISBN 10 
3527304584
ISBN 13 
9783527304585
Reliure
Relié
Nombre de pages
353
Coordonnées du fabricant
non disponible
Personne responsable
non disponible

Autres éditions populaires du même titre

9783527600168: Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications

Edition présentée

ISBN 10 :  3527600167 ISBN 13 :  9783527600168
Couverture souple