In-Situ Transmission Electron Microscopy Experiments: Design and Practice - Couverture rigide

Sharma, Renu

Couverture rigide

ISBN 10 : 3527347984 ISBN 13 : 9783527347988

Editeur : Blackwell Verlag GmbH, 2023

Synopsis

In-Situ Transmission Electron Microscopy Experiments

Design and execute cutting-edge experiments with transmission electron microscopy using this essential guide

In-situ microscopy is a recently-discovered and rapidly-developing approach to transmission electron microscopy (TEM) that allows for the study of atomic and/or molecular changes and processes while they are in progress. Experimental specimens are subjected to stimuli that replicate near real-world conditions and

their effects are observed at a previously unprecedented scale. Though in-situ microscopy is becoming an increasingly important approach to TEM, there are no current texts combining an up-to-date overview of this cutting-edge set of techniques with the experience of in-situ TEM professionals.

In-Situ Transmission Electron Microscopy Experiments meets this need with a work that synthesizes the collective experience of myriad collaborators. It constitutes a comprehensive guide for planning and performing in-situ TEM measurements,

incorporating both fundamental principles and novel techniques. Its combination of technical detail and practical how-to advice makes it an indispensable introduction to this area of research.

In-Situ Transmission Electron Microscopy Experiments readers will also find:

• Coverage of the entire experimental process, from method selection to experiment design to measurement and data analysis
• Detailed treatment of multimodal and correlative microscopy, data processing and machine learning, and more
• Discussion of future challenges and opportunities facing this field of research

In-Situ Transmission Electron Microscopy Experiments is essential for graduate students, post-doctoral fellows, and early career researchers entering the field of in-situ TEM.

A propos du livre

À propos de l?auteur

Renu Sharma, PhD, is an NIST Emeritus Fellow and worked as project leader there from 2009 to 2019. Before working at NIST, she was Senior Research Scientist in the LeRoy Eyring Center for Solid State Science at Arizona State University, as well as an affiliated faculty member in multiple departments. She is a pioneer in the field of transmission electron microscopy who has published extensively on the subject.

Détails de l'édition

• Éditeur: Blackwell Verlag GmbH
• Date d'édition: 2023
• Langue: anglais
• ISBN 10: 3527347984
• ISBN 13: 9783527347988
• Reliure: Relié
• Numéro d'édition: 1
• Nombre de pages: 384
• Coordonnées du fabricant: non disponible
• Personne responsable: non disponible