Three-Dimensional X-Ray Diffraction Microscopy: Mapping Polycrystals And Their Dynamics - Couverture rigide

Livre 103 sur 227: Springer Tracts in Modern Physics

Poulsen, Henning Friis

 
9783540223306: Three-Dimensional X-Ray Diffraction Microscopy: Mapping Polycrystals And Their Dynamics

Synopsis

Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing.

The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.

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Autres éditions populaires du même titre

9783662145432: Three-Dimensional X-Ray Diffraction Microscopy: Mapping Polycrystals and their Dynamics

Edition présentée

ISBN 10 :  366214543X ISBN 13 :  9783662145432
Editeur : Springer, 2013
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