Progress In Nano-Electro-Optics IV: Characterization Of Nano-Optical Materials And Optical Near-Field Interactions - Couverture rigide

 
9783540232360: Progress In Nano-Electro-Optics IV: Characterization Of Nano-Optical Materials And Optical Near-Field Interactions

Synopsis

This volume focuses on the characterization of nano-optical materials and optical near-field interactions. It begins with the techniques for characterizing the magneto-optical Kerr effect and continues with methods to determine structural and optical properties in high-quality quantum wires with high spatial uniformity. Further topics include: near-field luminescence mapping in InGaN/GaN single quantum well structures in order to interpret the recombination mechanism in InGaN-based nano-structures; and theoretical treatment of the optical near field and optical near-field interactions, providing the basis for investigating the signal transport and associated dissipation in nano-optical devices. Taken as a whole, this overview will be a valuable resource for engineers and scientists working in the field of nano-electro-optics.

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À propos de l'auteur

Dr. M. Ohtsu is currently a professor of The University of Tokyo. He is also a project leader of SORST Nanophotonics Team, Japan Science and TechnologyAgency. He has been a president of IEEE LEOS Japan Chapter. He has also been a member of the board of directors, Japan Society of Applied Physics. He is a fellow of Optical Society of America.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Autres éditions populaires du même titre

9783642062261: Progress in Nano-Electro Optics IV: Characterization of Nano-Optical Materials and Optical Near-Field Interactions

Edition présentée

ISBN 10 :  3642062261 ISBN 13 :  9783642062261
Editeur : Springer, 2010
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