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Powder Diffraction: The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data

Will, Georg

Edit� par Springer (edition 2006), 2005

ISBN 10 : 3540279857 ISBN 13 : 9783540279853

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Hardcover. Etat : Good. 2006. Ship within 24hrs. Satisfaction 100% guaranteed. APO/FPO addresses supported. N� de r�f. du vendeur 3540279857-11-1

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Powder Diffraction: The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data

Will, Georg

Edit� par Springer, 2005

ISBN 10 : 3540279857 ISBN 13 : 9783540279853

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Powder Diffraction : The Rietveld Method And the Two-Stage Method To Determine And Refine Crystal Structures From Powder Diffraction Data

Will, Georg

Edit� par Springer, 2005

ISBN 10 : 3540279857 ISBN 13 : 9783540279853

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Powder Diffraction : The Rietveld Method And the Two-Stage Method To Determine And Refine Crystal Structures From Powder Diffraction Data

Will, Georg

Edit� par Springer, 2005

ISBN 10 : 3540279857 ISBN 13 : 9783540279853

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Powder Diffraction

Georg Will

Edit� par Springer Berlin Heidelberg, 2005

ISBN 10 : 3540279857 ISBN 13 : 9783540279853

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Etat : New. An important relatively new field of application is in texture analysisGeorg Will studied physics and crystallography a the Technische Hochschule Muenchen. In 1961 he moved to the USA, where he worked at the Brook National Laboratory, where in collabo. N� de r�f. du vendeur 4886910

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Powder Diffraction: The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data

Will, Georg

Edit� par Springer, 2005

ISBN 10 : 3540279857 ISBN 13 : 9783540279853

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hardcover. Etat : New. In shrink wrap. Looks like an interesting title! N� de r�f. du vendeur Q-3540279857

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Powder Diffraction

Georg Will

Edit� par Springer, Berlin, Springer Berlin Heidelberg, Springer, 2005

ISBN 10 : 3540279857 ISBN 13 : 9783540279853

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Buch. Etat : Neu. Neuware - Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application. N� de r�f. du vendeur 9783540279853