Atomic Force Microscopy, Scanning Nearfield Optical Microscopy And Nanoscratching: Application to Rough And Natural Surfaces - Couverture rigide

Kaupp, Gerd

 
9783540284055: Atomic Force Microscopy, Scanning Nearfield Optical Microscopy And Nanoscratching: Application to Rough And Natural Surfaces
Couverture rigide
ISBN 10 : 3540284052 ISBN 13 : 9783540284055
Editeur : Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 2006

Synopsis

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Date d'édition
2006
Langue
anglais
ISBN 10 
3540284052
ISBN 13 
9783540284055
Reliure
Relié
Nombre de pages
304
Coordonnées du fabricant
Springer Nature Customer Service Center GmbH
ProductSafety@springernature.com

Europaplatz 3,69115 Heidelberg, Germany
Heidelberg
69115
Allemagne

Autres éditions populaires du même titre

9783642066634: Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces

Edition présentée

ISBN 10 :  3642066631 ISBN 13 :  9783642066634
Editeur : Springer, 2010
Couverture souple