Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK - Couverture rigide

Couverture rigide

ISBN 10 : 354031914X ISBN 13 : 9783540319146

Editeur : Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 2006

Synopsis

The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.

Détails de l'édition

• Éditeur: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
• Date d'édition: 2006
• Langue: anglais
• ISBN 10: 354031914X
• ISBN 13: 9783540319146
• Reliure: Relié
• Nombre de pages: 540
• Éditeur: Cullis A.G., Hutchison John L.
• Coordonnées du fabricant: non disponible
• Personne responsable: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Allemagne