Diffraction Analysis of the Microstructure of Materials - Couverture rigide

Couverture rigide

ISBN 10 : 3540405194 ISBN 13 : 9783540405191

Editeur : Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 2003

Synopsis

Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.

Détails de l'édition

• Éditeur: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
• Date d'édition: 2003
• Langue: anglais
• ISBN 10: 3540405194
• ISBN 13: 9783540405191
• Reliure: Relié
• Nombre de pages: 554
• Éditeur: Mittemeijer Eric J., Scardi Paolo
• Coordonnées du fabricant: non disponible
• Personne responsable: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Allemagne