Articles liés à High-Resolution Imaging on Spectrometry of Materials
High-Resolution Imaging on Spectrometry of Materials - Couverture rigide
Livre 66 sur 233: Springer Series in Materials Science
Synopsis
This book is an advanced text on high-resolution electron microscopy. It gives a survey of high-level electron microscopy and its application to surface and interface studies.
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High-Resolution Imaging and Spectrometry of Materials.
Edité par
Springer Verlag, 2002
ISBN 10 : 3540418180
ISBN 13 : 9783540418184
Ancien ou d'occasion
Couverture rigide
Vendeur : CSG Onlinebuch GMBH, Darmstadt, Allemagne
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Gebunden. Etat : Gut. Gebraucht - Gut Zustand: Gut, Mängelexemplar, XIV, 440 p. 211 illus., 32 in color About this book: This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students. Written for researchers. N° de réf. du vendeur 13801
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High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science, 50)
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
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Etat : New. In English. N° de réf. du vendeur ria9783540418184_new
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High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science, 50)
Vendeur : California Books, Miami, FL, Etats-Unis
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Etat : New. N° de réf. du vendeur I-9783540418184
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High-Resolution Imaging and Spectrometry of Materials
Edité par
Springer Berlin Heidelberg Dez 2002, 2002
ISBN 10 : 3540418180
ISBN 13 : 9783540418184
Neuf
Couverture rigide
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science. 460 pp. Englisch. N° de réf. du vendeur 9783540418184
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High-Resolution Imaging and Spectrometry of Materials
Edité par
Springer Berlin Heidelberg, 2002
ISBN 10 : 3540418180
ISBN 13 : 9783540418184
Neuf
Couverture rigide
Vendeur : moluna, Greven, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Gebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. In contrast to previously available books this not only reports on the state of the art of advanced electron microscopy but also contains examples of applicationsThe characterisation of materials and material systems is an essential aspect of materials . N° de réf. du vendeur 4889461
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Image fournie par le vendeur
High-Resolution Imaging and Spectrometry of Materials
Edité par
Springer, Springer Berlin Heidelberg Dez 2002, 2002
ISBN 10 : 3540418180
ISBN 13 : 9783540418184
Neuf
Couverture rigide
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 460 pp. Englisch. N° de réf. du vendeur 9783540418184
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High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science, 50)
Vendeur : BennettBooksLtd, Los Angeles, CA, Etats-Unis
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hardcover. Etat : New. In shrink wrap. Looks like an interesting title! N° de réf. du vendeur Q-3540418180
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High-Resolution Imaging and Spectrometry of Materials
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
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Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science. N° de réf. du vendeur 9783540418184
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High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science)
Vendeur : Revaluation Books, Exeter, Royaume-Uni
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Hardcover. Etat : Brand New. 440 pages. 9.25x6.25x0.75 inches. In Stock. N° de réf. du vendeur x-3540418180
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High-Resolution Imaging and Spectrometry of Materials
impression à la demandeVendeur : Books Puddle, Woodside, NY, Etats-Unis
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Etat : New. Print on Demand pp. 460. N° de réf. du vendeur 26345663
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