Synopsis
This book is an advanced text on high-resolution electron microscopy. It gives a survey of high-level electron microscopy and its application to surface and interface studies.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Autres éditions populaires du même titre
Résultats de recherche pour High-Resolution Imaging on Spectrometry of Materials
Image d'archives
High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science 50)
Edité par
Springer, 2003
ISBN 10 : 3540418180
ISBN 13 : 9783540418184
Ancien ou d'occasion
Couverture rigide
Vendeur : Zubal-Books, Since 1961, Cleveland, OH, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : Very Good. 442 pp., Hardcover, minor library markings, else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. N° de réf. du vendeur ZB1144941
Acheter D'occasion
EUR 21,39
Frais de port :
EUR 3,89
Vers Etats-Unis
Quantité disponible : 1 disponible(s)
Image d'archives
High-Resolution Imaging and Spectrometry of Materials.
Edité par
Springer, 2003
ISBN 10 : 3540418180
ISBN 13 : 9783540418184
Ancien ou d'occasion
Couverture rigide
Vendeur : Research Ink, Takoma Park, MD, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Hardcover. Etat : Very Good. xiv + 440 pp. Springer series in materials science, 50. Rubber-stamped on front free endpaper. book. N° de réf. du vendeur 36722
Acheter D'occasion
EUR 53,47
Frais de port :
EUR 3,46
Vers Etats-Unis
Quantité disponible : 1 disponible(s)
Image fournie par le vendeur
High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science, 50).
Edité par
Springer., 2002
ISBN 10 : 3540418180
ISBN 13 : 9783540418184
Ancien ou d'occasion
Couverture rigide
Vendeur : Universitätsbuchhandlung Herta Hold GmbH, Berlin, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
2003th ed. 16 x 23 cm. 456 pages. HC Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch. N° de réf. du vendeur 8691VB
Acheter D'occasion
EUR 35
Frais de port :
EUR 30
De Allemagne vers Etats-Unis
Quantité disponible : 1 disponible(s)
Image d'archives
High-Resolution Imaging and Spectrometry of Materials.
Edité par
Springer Verlag, 2002
ISBN 10 : 3540418180
ISBN 13 : 9783540418184
Ancien ou d'occasion
Couverture rigide
Vendeur : CSG Onlinebuch GMBH, Darmstadt, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Gebunden. Etat : Gut. Gebraucht - Gut Zustand: Gut, Mängelexemplar, XIV, 440 p. 211 illus., 32 in color About this book: This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students. Written for researchers. N° de réf. du vendeur 13801
Acheter D'occasion
EUR 46,75
Frais de port :
EUR 95
De Allemagne vers Etats-Unis
Quantité disponible : 1 disponible(s)
Image d'archives
High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science, 50)
Vendeur : Best Price, Torrance, CA, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. SUPER FAST SHIPPING. N° de réf. du vendeur 9783540418184
Acheter neuf
EUR 150,48
Frais de port :
EUR 7,77
Vers Etats-Unis
Quantité disponible : 4 disponible(s)
Image d'archives
High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science, 50)
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. In. N° de réf. du vendeur ria9783540418184_new
Acheter neuf
EUR 157,46
Frais de port :
EUR 13,65
De Royaume-Uni vers Etats-Unis
Quantité disponible : Plus de 20 disponibles
Image fournie par le vendeur
High-Resolution Imaging and Spectrometry of Materials
Edité par
Springer Berlin Heidelberg Dez 2002, 2002
ISBN 10 : 3540418180
ISBN 13 : 9783540418184
Neuf
Couverture rigide
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science. 460 pp. Englisch. N° de réf. du vendeur 9783540418184
Acheter neuf
EUR 160,49
Frais de port :
EUR 23
De Allemagne vers Etats-Unis
Quantité disponible : 2 disponible(s)
Image fournie par le vendeur
High-Resolution Imaging and Spectrometry of Materials
Edité par
Springer Berlin Heidelberg, 2002
ISBN 10 : 3540418180
ISBN 13 : 9783540418184
Neuf
Couverture rigide
Vendeur : moluna, Greven, Allemagne
Évaluation du vendeur 4 sur 5 étoiles
Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. In contrast to previously available books this not only reports on the state of the art of advanced electron microscopy but also contains examples of applicationsThe characterisation of materials and material systems is an essential aspect of materials . N° de réf. du vendeur 4889461
Acheter neuf
EUR 136,16
Frais de port :
EUR 48,99
De Allemagne vers Etats-Unis
Quantité disponible : Plus de 20 disponibles
Image fournie par le vendeur
High-Resolution Imaging and Spectrometry of Materials
Edité par
Springer-Verlag GmbH, 2002
ISBN 10 : 3540418180
ISBN 13 : 9783540418184
Neuf
Couverture rigide
Vendeur : preigu, Osnabrück, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. High-Resolution Imaging and Spectrometry of Materials | Manfred Rühle (u. a.) | Buch | xiv | Englisch | 2002 | Springer-Verlag GmbH | EAN 9783540418184 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. N° de réf. du vendeur 103111737
Acheter neuf
EUR 141,30
Frais de port :
EUR 70
De Allemagne vers Etats-Unis
Quantité disponible : 5 disponible(s)
Image fournie par le vendeur
High-Resolution Imaging and Spectrometry of Materials
Edité par
Springer Berlin Heidelberg, Springer Berlin Heidelberg Dez 2002, 2002
ISBN 10 : 3540418180
ISBN 13 : 9783540418184
Neuf
Couverture rigide
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. Neuware -The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 460 pp. Englisch. N° de réf. du vendeur 9783540418184
Acheter neuf
EUR 160,49
Frais de port :
EUR 60
De Allemagne vers Etats-Unis
Quantité disponible : 2 disponible(s)