Transmission Electron Microscopy: Physics of Image Formation and Microanalysis - Couverture souple

Reimer, Ludwig

Couverture souple

ISBN 10 : 3540568492 ISBN 13 : 9783540568490

Editeur : Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 1993

Synopsis

This stuy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of the particle-and wave-optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also analyzed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure determination and the imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. This third edition includes a brief discussion of Schottky emission guns, some clarification of minor details, and references to the recent literature.

Détails de l'édition

• Éditeur: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
• Date d'édition: 1993
• Langue: anglais
• ISBN 10: 3540568492
• ISBN 13: 9783540568490
• Reliure: Broché
• Numéro d'édition: 3
• Nombre de pages: 545
• Coordonnées du fabricant: non disponible
• Personne responsable: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Allemagne