Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces - Couverture rigide

9783540594109: Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces

Couverture rigide

ISBN 10 : 3540594108 ISBN 13 : 9783540594109

Editeur : Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 1995

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This text describes recent developments in optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer. These "epioptic" techniques are now widely applied to semiconductor surfaces and interfaces and include polarised reflection techniques such as reflection anisotropy spectroscopy and spectroscopic ellipsometry, Raman scattering, and optical second harmonic and sum frequency generation. Epioptics has great potential in the area of growth monitoring, and in situ monitoring of semiconductor growth with submonolayer sensitivity has now been demonstrated in growth reactors under normal operating conditions. The book emphasizes recent studies of submonolayer growth on semiconductor surfaces.

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�diteurSpringer-Verlag Berlin and Heidelberg GmbH & Co. K
Date d'�dition1995
ISBN 10 3540594108
ISBN 13 9783540594109
ReliureReli�
Langueanglais
Nombre de pages242
�diteurMcGilp J.F., Etc., Weaire D., Patterson C.
Coordonn�es du fabricantnon disponible

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�tat : Satisfaisant

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Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces

McGilp, J. F. & Patterson, C. H. (eds)

Edit� par Springer, 1995

ISBN 10 : 3540594108 ISBN 13 : 9783540594109

Ancien ou d'occasion Couverture rigide

Vendeur : Anybook.com, Lincoln, Royaume-Uni

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Etat : Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,550grams, ISBN:9783540594109. N� de r�f. du vendeur 9608212

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