Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces - Couverture rigide

Couverture rigide

ISBN 10 : 3540594108 ISBN 13 : 9783540594109

Editeur : Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 1995

Synopsis

This text describes recent developments in optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer. These "epioptic" techniques are now widely applied to semiconductor surfaces and interfaces and include polarised reflection techniques such as reflection anisotropy spectroscopy and spectroscopic ellipsometry, Raman scattering, and optical second harmonic and sum frequency generation. Epioptics has great potential in the area of growth monitoring, and in situ monitoring of semiconductor growth with submonolayer sensitivity has now been demonstrated in growth reactors under normal operating conditions. The book emphasizes recent studies of submonolayer growth on semiconductor surfaces.

Détails de l'édition

• Éditeur: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
• Date d'édition: 1995
• Langue: anglais
• ISBN 10: 3540594108
• ISBN 13: 9783540594109
• Reliure: Relié
• Nombre de pages: 242
• Éditeur: McGilp J.F., Etc., Weaire D., Patterson C.
• Coordonnées du fabricant: non disponible
• Personne responsable: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Allemagne