Articles liés à High-Resolution X-Ray Scattering from Thin Films and...
High-Resolution X-Ray Scattering from Thin Films and Multilayers - Couverture rigide
Livre 59 sur 227: Springer Tracts in Modern Physics
Synopsis
This critical overview presents experimental methods for solving most frequent structural problems of mono-crystalline thin films and layered systems, including thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is intended as a reference for experimentalists who want to improve their knowledge on modern X-ray methods for thin film analysis.
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