High-Resolution X-Ray Scattering from Thin Films and Multilayers - Couverture rigide

Livre 59 sur 227: Springer Tracts in Modern Physics

Holy, V.; Pietsch, U.; Baumbach, T.

 
9783540620297: High-Resolution X-Ray Scattering from Thin Films and Multilayers
Couverture rigide
ISBN 10 : 354062029X ISBN 13 : 9783540620297
Editeur : Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 1998

Synopsis

This critical overview presents experimental methods for solving most frequent structural problems of mono-crystalline thin films and layered systems, including thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is intended as a reference for experimentalists who want to improve their knowledge on modern X-ray methods for thin film analysis.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Éditeur
Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Date d'édition
1998
Langue
anglais
ISBN 10 
354062029X
ISBN 13 
9783540620297
Reliure
Relié
Nombre de pages
190
Coordonnées du fabricant
non disponible
Personne responsable
non disponible