Scanning Tunneling Microscopy And Its Applications. 2nd, Revised Edition - Couverture rigide

Bai, Chunli

Couverture rigide

ISBN 10 : 3540657150 ISBN 13 : 9783540657156

Editeur : Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 2000

Synopsis

This volume presents a unified view of the rapidly growing field of STM, and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After examining the available instrumentation and the methods for tip and surface preparation, the book provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nano-fabrication. It examines the limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field.

Détails de l'édition

• Éditeur: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
• Date d'édition: 2000
• Langue: anglais
• ISBN 10: 3540657150
• ISBN 13: 9783540657156
• Reliure: Relié
• Numéro d'édition: 2
• Nombre de pages: 384
• Coordonnées du fabricant: non disponible
• Personne responsable: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Allemagne