Transmission Electron Microscopy and Diffractometry of Materials - Couverture rigide

Fultz, Brent; Howe, James

 
9783540738855: Transmission Electron Microscopy and Diffractometry of Materials
Couverture rigide
ISBN 10 : 3540738851 ISBN 13 : 9783540738855
Editeur : Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 2007

Synopsis

This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Éditeur
Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Date d'édition
2007
Langue
anglais
ISBN 10 
3540738851
ISBN 13 
9783540738855
Reliure
Relié
Numéro d'édition
2
Nombre de pages
780
Coordonnées du fabricant
non disponible
Personne responsable
CMN Printpool Inh. Mathis Neumann
https://www.also.com/ec/cms5/en_6000/6000/index.jsp

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