Articles liés à Electromigration: Studied With the Optical Microscopy...

Electromigration: Studied With the Optical Microscopy Imaging Method - Couverture souple

Li, Linghong

 
9783639088137: Electromigration: Studied With the Optical Microscopy Imaging Method
Couverture souple
ISBN 10 : 3639088131 ISBN 13 : 9783639088137
Editeur : VDM Verlag Dr. Mueller E.K., 2008

Synopsis

Electromigration is a microscopic phenomenon involving electric field-induced diffusion, which is very relevant to damage in interconnections. A common method for monitoring interconnection degradation is through electrical resistance measurements, which requires direct electrical contact. It is desirable to develop non-contact methods to monitor electromigration damage formation. In this thesis, we propose a novel Optical Microscopy Imaging Method (OMIM), and we provide a theoretical description and experimental results. OMIM not only pro-vides a new method for studying electromigration, but also provides a useful method for studying other micro-devices and materials in a non-contact mode.

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Éditeur
VDM Verlag Dr. Mueller E.K.
Date d'édition
2008
Langue
anglais
ISBN 10 
3639088131
ISBN 13 
9783639088137
Reliure
Broché
Nombre de pages
76
Coordonnées du fabricant
non disponible
Personne responsable
non disponible