Data mining for degradation modelling - Couverture souple

Lin, Hungyen

Couverture souple

ISBN 10 : 3639100786 ISBN 13 : 9783639100785

Editeur : VDM Verlag, 2008

Synopsis

Accelerated degradation testing is widely accepted in competitive industries. As there is no longer the need to test till failures, there are tremendous cost and time benefits on fully capitalizing on such a testing regime. Consequently, this research has aimed for better understanding of the relationship between design and degradation using the degradation data. Artificial neural network is widely used for complex problems in the literature. This book proposes and demonstrates the neural network modelling methodology into capturing the non parametric relationship between design and degradation, specific to the particular problem domain. In particular, two models of different practical significance are developed and compiled as Windows executables for predicting material performances.

A propos du livre

À propos de l?auteur

Hungyen Lin received B.Comp Sys. Eng. (Honors) from The University of Adelaide in 2003 and the M.S. degree from UniSA in 2005. He is currently working towards a Ph.D. degree in Electrical & Electronic Engineering at The University of Adelaide on an APA scholarship. His current research involves THz near-field imaging and signal processing.

Détails de l'édition

• Éditeur: VDM Verlag
• Date d'édition: 2008
• Langue: anglais
• ISBN 10: 3639100786
• ISBN 13: 9783639100785
• Reliure: Broché
• Nombre de pages: 124
• Coordonnées du fabricant: non disponible
• Personne responsable: non disponible