DIFFERENTIAL ITEM FUNCTION AMPLIFICATION AND CANCELLATION: IN APPLICATION OF ITEM RESPONSE TESTLET MODEL - Couverture souple

Bao, Han

 
9783639165494: DIFFERENTIAL ITEM FUNCTION AMPLIFICATION AND CANCELLATION: IN APPLICATION OF ITEM RESPONSE TESTLET MODEL
Couverture souple
ISBN 10 : 3639165497 ISBN 13 : 9783639165494
Editeur : VDM Verlag, 2009

Synopsis

Many educational tests use testlets as a way of providing context. When testlet effect and item idiosyncratic features of individual items are both considered to be the reasons of DIF in many educational tests using testlets, it is interesting to investigate the phenomena of DIF amplification and cancellation resulting from the interactive effects of these two factors. This research presented a study based on a multiple-group testlet item response theory model to examine in detail different situations of DIF amplification and cancellation at the item and testlet level using testlet characteristic curve procedures with signed/ unsigned area indices and logistic regression procedure. The testlet DIF model was estimated using a hierarchical Bayesian framework with the Markov Chain Monte Carlo method. The simulation study investigated all of the possible conditions of DIF amplification and cancellation. Real data analysis indicated the existence of testlet effect and its magnitudes of difference on the means and/or variance of testlet distribution between manifest groups such as gender or ethnicity.

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Présentation de l'éditeur

Many educational tests use testlets as a way of providing context. When testlet effect and item idiosyncratic features of individual items are both considered to be the reasons of DIF in many educational tests using testlets, it is interesting to investigate the phenomena of DIF amplification and cancellation resulting from the interactive effects of these two factors. This research presented a study based on a multiple-group testlet item response theory model to examine in detail different situations of DIF amplification and cancellation at the item and testlet level using testlet characteristic curve procedures with signed/ unsigned area indices and logistic regression procedure. The testlet DIF model was estimated using a hierarchical Bayesian framework with the Markov Chain Monte Carlo method. The simulation study investigated all of the possible conditions of DIF amplification and cancellation. Real data analysis indicated the existence of testlet effect and its magnitudes of difference on the means and/or variance of testlet distribution between manifest groups such as gender or ethnicity.

Biographie de l'auteur

Dr. Han Bao is an Assistant Professor at the Shanghai Normal University, College Of Education. She graduated from the University of Maryland, College Park, majoring in Measurement, Statistics and Evaluation. Her research interests lie in Educatinal Statisics & Measurement theories.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
VDM Verlag
Date d'édition
2009
Langue
anglais
ISBN 10 
3639165497
ISBN 13 
9783639165494
Reliure
Broché
Nombre de pages
176
Coordonnées du fabricant
non disponible
Personne responsable
non disponible