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Study of Recrystallization via Electrical Resistivity Measurements: A novel approach based on isogeometric approximation using splines and robust numerical differentiation - Couverture souple

Vajpai, Sanjay

 
9783639182392: Study of Recrystallization via Electrical Resistivity Measurements: A novel approach based on isogeometric approximation using splines and robust numerical differentiation
Couverture souple
ISBN 10 : 3639182391 ISBN 13 : 9783639182392
Editeur : VDM Verlag, 2009

Synopsis

Recrystallization has been extensively utilized for variety of materials to modify the microstructure and achieving desired mechanical properties. Therefore, characterization of recrystallization is an important aspect. However, most of the existing characterization techniques are either not in-situ in nature or too complex. In the present work, a novel method of spline-based isogeometric approximation and robust numerical differentiation has been originated and employed to the in-situ resistivity data to characterize recrystallization. It has been shown that this method is able to reveal the elusive effects of recrystallization from the in-situ electrical resistivity measurements. An extensive experimental work on Al-Mg and Al-Mg-Fe-Mn alloys, which are extensively used in automotive industry, showed that this method is sensitive, reliable, accurate and efficient. An extensive literature on the recrystallization and related phenomena, resistivity measurements and cubic splines has also been provided in the book. This work should be useful to the people involved in research and development activities, especially characterization of materials, in industry as well as academia.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

Recrystallization has been extensively utilized for variety of materials to modify the microstructure and achieving desired mechanical properties. Therefore, characterization of recrystallization is an important aspect. However, most of the existing characterization techniques are either not in-situ in nature or too complex. In the present work, a novel method of spline-based isogeometric approximation and robust numerical differentiation has been originated and employed to the in-situ resistivity data to characterize recrystallization. It has been shown that this method is able to reveal the elusive effects of recrystallization from the in-situ electrical resistivity measurements. An extensive experimental work on Al-Mg and Al-Mg-Fe-Mn alloys, which are extensively used in automotive industry, showed that this method is sensitive, reliable, accurate and efficient. An extensive literature on the recrystallization and related phenomena, resistivity measurements and cubic splines has also been provided in the book. This work should be useful to the people involved in research and development activities, especially characterization of materials, in industry as well as academia.

Biographie de l'auteur

(Top)Sanjay K Vajpai, BEng, MTech, MASc,is a Research Scholar in Materials and Metallurgical Engineering at IIT Kanpur, India. (Bottom)Dmitri V Malakhov, PhD, is an Associate Professor at McMaster University, Canada. He received his PhD in Chemistry from Russian Academy of Sciences, Novosibirsk. He is an authority on computational thermodynamics.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
VDM Verlag
Date d'édition
2009
Langue
anglais
ISBN 10 
3639182391
ISBN 13 
9783639182392
Reliure
Broché
Nombre de pages
96
Coordonnées du fabricant
non disponible
Personne responsable
non disponible