Optical and magneto-optic Kerr effects of MnBi, Ni2MnGa, and Gd5Si2Ge2: Experiments and TB-LMTO calculations - Couverture souple

Park, Joong-Mok; W., David

 
9783639208368: Optical and magneto-optic Kerr effects of MnBi, Ni2MnGa, and Gd5Si2Ge2: Experiments and TB-LMTO calculations
Couverture souple
ISBN 10 : 3639208366 ISBN 13 : 9783639208368
Editeur : VDM Verlag Dr. Müller, 2010

Synopsis

The magneto-optic Kerr angle spectrum of a single crystal of MnBi was measured at room temperature and also calculated with the TB-LMTO methods including the spin-orbit interaction. First-principle calculations and experimental results with our single crystal MnBi were compared. The complex dielectric constants and magneto-optic Kerr spectra of electro-polished (100), (110), and (111) planes Ni2MnGa were measured. Also optical and magneto-optical spectra were calculated with the TB-LMTO methods including the spin-orbit interaction. Angle-dependent reflectance difference spectroscopy of Gd5Si2Ge2 and Tb5Si2.2Ge1.8, which are optically anisotropic materials, were measured with the Kerr spectrometer by rotating the samples. The complex dielectric constants of (100) and (001) planes Gd5Si2Ge2 were measured by the spectroscopic ellipsometer. Two reflectance differences, measured by the Kerr spectrometer at near normal incidence and converted from the dielectric constants measured by ellipsometer at oblique incidence, agreed well.

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Présentation de l'éditeur

The magneto-optic Kerr angle spectrum of a single crystal of MnBi was measured at room temperature and also calculated with the TB-LMTO methods including the spin-orbit interaction. First-principle calculations and experimental results with our single crystal MnBi were compared. The complex dielectric constants and magneto-optic Kerr spectra of electro-polished (100), (110), and (111) planes Ni2MnGa were measured. Also optical and magneto-optical spectra were calculated with the TB-LMTO methods including the spin-orbit interaction. Angle-dependent reflectance difference spectroscopy of Gd5Si2Ge2 and Tb5Si2.2Ge1.8, which are optically anisotropic materials, were measured with the Kerr spectrometer by rotating the samples. The complex dielectric constants of (100) and (001) planes Gd5Si2Ge2 were measured by the spectroscopic ellipsometer. Two reflectance differences, measured by the Kerr spectrometer at near normal incidence and converted from the dielectric constants measured by ellipsometer at oblique incidence, agreed well.

Biographie de l'auteur

Joong-Mok Park was born in 1967 in Korea. He earned B.S. and masters degree in physics at Korea University, Seoul, Korea. He earned Ph.D degree in condensed matter physics at Iowa State University. Major interests are optical properties of condensed matters and photonic crystals.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
VDM Verlag Dr. Müller
Date d'édition
2010
Langue
anglais
ISBN 10 
3639208366
ISBN 13 
9783639208368
Reliure
Broché
Nombre de pages
140
Coordonnées du fabricant
non disponible
Personne responsable
non disponible