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Hot Carrier Degradation in CMOS LC Injection-Locked Frequency Dividers: RF Performance of CMOS LC Injection-locked Frequency Dividers Under Over-voltage Operation - Couverture souple

Jang, Sheng-Lyang

 
9783639823455: Hot Carrier Degradation in CMOS LC Injection-Locked Frequency Dividers: RF Performance of CMOS LC Injection-locked Frequency Dividers Under Over-voltage Operation
Couverture souple
ISBN 10 : 3639823451 ISBN 13 : 9783639823455
Editeur : VDM Verlag, 2016

Synopsis

LC-tank injection-locked frequency divider (ILFD) is a high-speed and low-power FD, the use of inductor in ILFD increases the voltage swing in the circuit and the ILFD is subjected to stressing damage. This book reports the RF performance of CMOS LC ILFDs under over-voltage operation to accelerate the study. Although it is well-known an ILFD will have degradation in RF performance after hot-carrier stress. It is not clear how the degradation shows up in the ILFD characteristics. The experimental studies bridge the gap between the real degradation phenomena and a concept that an ILFD has degradation after hot-carrier stress. The studied circuits include even-modulus and odd-modulus ILFDs.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Éditeur
VDM Verlag
Date d'édition
2016
Langue
anglais
ISBN 10 
3639823451
ISBN 13 
9783639823455
Reliure
Broché
Nombre de pages
132
Coordonnées du fabricant
non disponible
Personne responsable
non disponible