Noncontact Atomic Force Microscopy - Couverture rigide

Couverture rigide

ISBN 10 : 3642014941 ISBN 13 : 9783642014949

Editeur : Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 2009

Synopsis

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

A propos du livre

Présentation de l'éditeur

This report on scanning probe microscopy covers the latest in many related topics such as force spectroscopy and mapping with atomic resolution, atomic manipulation, magnetic exchange force microscopy, atomic and molecular imaging in liquids, and much more.

Détails de l'édition

• Éditeur: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
• Date d'édition: 2009
• Langue: anglais
• ISBN 10: 3642014941
• ISBN 13: 9783642014949
• Reliure: Relié
• Nombre de pages: 419
• Éditeur: Morita Seizo, Giessibl Franz J., Wiesendanger Roland
• Coordonnées du fabricant: Springer Nature Customer Service Center GmbH; ProductSafety@springernature.com; ; Europaplatz 3; Heidelberg; 69115; Allemagne