Articles liés à Applied Scanning Probe Methods I
Synopsis
This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.
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Applied Scanning Probe Methods I
Edité par
Springer Berlin Heidelberg Dez 2010, 2010
ISBN 10 : 3642056024
ISBN 13 : 9783642056024
Neuf
Taschenbuch
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. 500 pp. Englisch. N° de réf. du vendeur 9783642056024
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Applied Scanning Probe Methods I
Edité par
Springer Berlin Heidelberg, 2010
ISBN 10 : 3642056024
ISBN 13 : 9783642056024
Neuf
Couverture souple
Vendeur : moluna, Greven, Allemagne
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book summarizing the state-of-the-art of this techniqueReal industrial applications includedExamining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely an. N° de réf. du vendeur 5044737
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Applied Scanning Probe Methods I
Vendeur : Books Puddle, New York, NY, Etats-Unis
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Etat : New. pp. xx + 476. N° de réf. du vendeur 263064504
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Applied Scanning Probe Methods I
impression à la demandeVendeur : Majestic Books, Hounslow, Royaume-Uni
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Etat : New. Print on Demand pp. xx + 476. N° de réf. du vendeur 5864807
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Applied Scanning Probe Methods I
impression à la demandeVendeur : Biblios, Frankfurt am main, HESSE, Allemagne
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Etat : New. PRINT ON DEMAND pp. xx + 476. N° de réf. du vendeur 183064498
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Applied Scanning Probe Methods I
Edité par
Springer Berlin Heidelberg, Springer Berlin Heidelberg Dez 2010, 2010
ISBN 10 : 3642056024
ISBN 13 : 9783642056024
Neuf
Taschenbuch
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 500 pp. Englisch. N° de réf. du vendeur 9783642056024
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Applied Scanning Probe Methods I
Edité par
Springer Berlin Heidelberg, 2010
ISBN 10 : 3642056024
ISBN 13 : 9783642056024
Neuf
Taschenbuch
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This volume examines the physical and technical foundation for recent progress in appliednear-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book. N° de réf. du vendeur 9783642056024
Quantité disponible : 1 disponible(s)
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Applied Scanning Probe Methods: Vol 1
Vendeur : Revaluation Books, Exeter, Royaume-Uni
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Paperback. Etat : Brand New. 2004 edition. 496 pages. 9.21x6.06x0.87 inches. In Stock. N° de réf. du vendeur 3642056024
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Applied Scanning Probe Methods I (NanoScience and Technology)
Edité par
Springer, 2010
ISBN 10 : 3642056024
ISBN 13 : 9783642056024
Ancien ou d'occasion
Paperback
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
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Paperback. Etat : Like New. Like New. book. N° de réf. du vendeur ERICA79036420560246
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