Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons - Couverture souple

Livre 109 sur 227: Springer Tracts in Modern Physics

Schubert, Mathias

 
9783642062285: Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons
Couverture souple
ISBN 10 : 3642062288 ISBN 13 : 9783642062285
Editeur : Springer, 2010

Synopsis

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects.

A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Springer
Date d'édition
2010
Langue
anglais
ISBN 10 
3642062288
ISBN 13 
9783642062285
Reliure
Broché
Nombre de pages
208
Coordonnées du fabricant
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Poststr. 9
Darmstadt
64293
Allemagne

Autres éditions populaires du même titre

9783540232490: Infrared Ellipsometry On Semiconductor Layer Structures: Phonons, Plasmons, And Polaritons

Edition présentée

ISBN 10 :  3540232494 ISBN 13 :  9783540232490
Editeur : Springer-Verlag Berlin and Heide..., 2004
Couverture rigide