Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Couverture souple

Livre 6 sur 233: Springer Series in Materials Science

Rein, Stefan

 
9783642064531: Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications
Couverture souple
ISBN 10 : 3642064531 ISBN 13 : 9783642064531
Editeur : Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 2010

Synopsis

Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.

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À propos de l?auteur

10/99 "Gustav-Mie-Preis" awarded for the diploma thesis by the Faculty of Physics at Albert-Ludwigs-University Freiburg

09/99 - 05/04 PhD thesis in physics at Fraunhofer ISE and University of Konstanz:
"Lifetime spectroscopy as a method of defect characterization in silicon for photovoltaic applications" (overall grade: summa cum laude)

08/95 - 01/97 Undergraduate assistant at Fraunhofer ISE in the area of solar cell
characterization

12/98 - 08/99 Research assistant at Fraunhofer ISE
1. in the department of solar cells - materials - technology
2. in the department of thermal optical systems

06/04 - today Research assistant at Fraunhofer ISE

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Date d'édition
2010
Langue
anglais
ISBN 10 
3642064531
ISBN 13 
9783642064531
Reliure
Broché
Numéro d'édition
1
Nombre de pages
492
Coordonnées du fabricant
non disponible
Personne responsable
CMN Printpool Inh. Mathis Neumann
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Hamburg
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Autres éditions populaires du même titre

9783540253037: Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications

Edition présentée

ISBN 10 :  3540253033 ISBN 13 :  9783540253037
Editeur : Springer-Verlag Berlin and Heide..., 2005
Couverture rigide