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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Couverture souple
Synopsis
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.
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À propos de l?auteur
10/99 "Gustav-Mie-Preis" awarded for the diploma thesis by the Faculty of Physics at Albert-Ludwigs-University Freiburg
09/99 - 05/04 PhD thesis in physics at Fraunhofer ISE and University of Konstanz:
"Lifetime spectroscopy as a method of defect characterization in silicon for photovoltaic applications" (overall grade: summa cum laude)
08/95 - 01/97 Undergraduate assistant at Fraunhofer ISE in the area of solar cell
characterization
12/98 - 08/99 Research assistant at Fraunhofer ISE
1. in the department of solar cells - materials - technology
2. in the department of thermal optical systems
06/04 - today Research assistant at Fraunhofer ISE
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
- ÉditeurSpringer-Verlag Berlin and Heidelberg GmbH & Co. K
- Date d'édition2010
- ISBN 10 3642064531
- ISBN 13 9783642064531
- ReliureBroché
- Langueanglais
- Nombre de pages492
- Coordonnées du fabricantnon disponible
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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (Springer Series in Materials Science, 85)
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Lifetime Spectroscopy
Edité par
Springer Berlin Heidelberg, 2010
ISBN 10 : 3642064531
ISBN 13 : 9783642064531
Neuf
Couverture souple
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Lifetime Spectroscopy
Edité par
Springer Berlin Heidelberg Okt 2010, 2010
ISBN 10 : 3642064531
ISBN 13 : 9783642064531
Neuf
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Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy. 520 pp. Englisch. N° de réf. du vendeur 9783642064531
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Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications
Edité par
Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2010
ISBN 10 : 3642064531
ISBN 13 : 9783642064531
Neuf
Taschenbuch
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
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Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy. N° de réf. du vendeur 9783642064531
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Lifetime Spectroscopy
Edité par
Springer Berlin Heidelberg, Springer Berlin Heidelberg Okt 2010, 2010
ISBN 10 : 3642064531
ISBN 13 : 9783642064531
Neuf
Taschenbuch
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
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Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 520 pp. Englisch. N° de réf. du vendeur 9783642064531
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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (Springer Series in Materials Science, 85)
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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications
Vendeur : Revaluation Books, Exeter, Royaume-Uni
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Paperback. Etat : Brand New. 515 pages. 9.21x6.14x1.05 inches. In Stock. N° de réf. du vendeur x-3642064531
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