Articles liés à High-Resolution Imaging and Spectrometry of Materials
High-Resolution Imaging and Spectrometry of Materials - Couverture souple
Livre 66 sur 233: Springer Series in Materials Science
Synopsis
This book is an advanced text on high-resolution electron microscopy. It gives a survey of high-level electron microscopy and its application to surface and interface studies.
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High-Resolution Imaging and Spectrometry of Materials (eng)
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High-Resolution Imaging and Spectrometry of Materials
Edité par
Springer Berlin Heidelberg Dez 2010, 2010
ISBN 10 : 3642075258
ISBN 13 : 9783642075254
Neuf
Taschenbuch
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science. 456 pp. Englisch. N° de réf. du vendeur 9783642075254
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High-Resolution Imaging and Spectrometry of Materials
Edité par
Springer Berlin Heidelberg, 2010
ISBN 10 : 3642075258
ISBN 13 : 9783642075254
Neuf
Couverture souple
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. In contrast to previously available books this not only reports on the state of the art of advanced electron microscopy but also contains examples of applicationsThe characterisation of materials and material systems is an essential aspect of materials . N° de réf. du vendeur 5046592
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High-Resolution Imaging and Spectrometry of Materials
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Taschenbuch. Etat : Neu. High-Resolution Imaging and Spectrometry of Materials | Frank Ernst (u. a.) | Taschenbuch | Springer Series in Materials Science | xiv | Englisch | 2010 | Springer | EAN 9783642075254 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. N° de réf. du vendeur 107174663
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High-Resolution Imaging and Spectrometry of Materials
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Etat : New. pp. xiv + 440. N° de réf. du vendeur 2614416147
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High-Resolution Imaging and Spectrometry of Materials
Edité par
Springer Berlin Heidelberg, Springer Dez 2010, 2010
ISBN 10 : 3642075258
ISBN 13 : 9783642075254
Neuf
Taschenbuch
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
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Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 456 pp. Englisch. N° de réf. du vendeur 9783642075254
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High-Resolution Imaging and Spectrometry of Materials
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Etat : New. Print on Demand pp. xiv + 440 211 Illus. (32 Col.). N° de réf. du vendeur 11290316
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High-Resolution Imaging and Spectrometry of Materials
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High-Resolution Imaging and Spectrometry of Materials
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Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science. N° de réf. du vendeur 9783642075254
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High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science, 50)
Edité par
Springer, 2010
ISBN 10 : 3642075258
ISBN 13 : 9783642075254
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