Articles liés à Applied Scanning Probe Methods XII: Characterization
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This volume examines the physical and technical foundation for progress in applied scanning probe techniques. It first introduces scanning probe microscopy, including sensor technology and tip characterization, and then details various industrial applications.
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- ÉditeurSpringer
- Date d'édition2010
- ISBN 10 3642098703
- ISBN 13 9783642098703
- ReliureBroché
- Nombre de pages280
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Applied Scanning Probe Methods XII
Edité par
Springer Berlin Heidelberg
(2010)
ISBN 10 : 3642098703
ISBN 13 : 9783642098703
Neuf
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Description du livre Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book summarizing the state of the art of this techniqueReal industrial applications includedCrack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical . N° de réf. du vendeur 5048862
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Applied Scanning Probe Methods XII : Characterization
Edité par
Springer Berlin Heidelberg
(2010)
ISBN 10 : 3642098703
ISBN 13 : 9783642098703
Neuf
Taschenbuch
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Description du livre Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1-4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors' knowledge, this was shown for the rst time by Hild et al. in [5]. 16. N° de réf. du vendeur 9783642098703
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Applied Scanning Probe Methods XII
Edité par
Springer Berlin Heidelberg Nov 2010
(2010)
ISBN 10 : 3642098703
ISBN 13 : 9783642098703
Neuf
Taschenbuch
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Description du livre Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1-4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors' knowledge, this was shown for the rst time by Hild et al. in [5]. 16. 280 pp. Englisch. N° de réf. du vendeur 9783642098703
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Applied Scanning Probe Methods XII: Characterization
Edité par
Springer
(2010)
ISBN 10 : 3642098703
ISBN 13 : 9783642098703
Neuf
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Description du livre Paperback. Etat : Brand New. reprint edition. 280 pages. 9.00x6.00x0.66 inches. In Stock. N° de réf. du vendeur __3642098703
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