Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Couverture rigide

Livre 74 sur 153: Springer Tracts in Advanced Robotics

Xie, Hui ; Onal, Cagdas ; R�gnier, St�phane ; Sitti, Metin

9783642203282: Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments

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ISBN 10 : 3642203280 ISBN 13 : 9783642203282

Editeur : Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 2011

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This clearly-expressed, well-organized book introduces designs and prototypes of nanorobotic systems in detail, examining innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.

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Les informations fournies dans la section � A propos du livre � peuvent faire r�f�rence � une autre �dition de ce titre.

�diteur: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Date d'�dition: 2011
Langue: anglais
ISBN 10: 3642203280
ISBN 13: 9783642203282
Reliure: Reli�
Nombre de pages: 358
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9783642445019: Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments

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Atomic Force Microscopy Based Nanorobotics (eng)

Xie, Hui

Edit� par Springer, 2011

ISBN 10 : 3642203280 ISBN 13 : 9783642203282

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Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments (Springer Tracts in Advanced Robotics, 71)

Xie, Hui,Onal, Cagdas,R� gnier, St� phane,Sitti, Metin

Edit� par Springer, 2011

ISBN 10 : 3642203280 ISBN 13 : 9783642203282

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hardcover. Etat : Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! N� de r�f. du vendeur S_436655669

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Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments (Springer Tracts in Advanced Robotics, 71)

Xie, Hui; Onal, Cagdas; R�gnier, St�phane; Sitti, Metin

Edit� par Springer, 2011

ISBN 10 : 3642203280 ISBN 13 : 9783642203282

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Atomic Force Microscopy Based Nanorobotics

Hui Xie

Edit� par Springer Berlin Heidelberg, Springer Berlin Heidelberg Sep 2011, 2011

ISBN 10 : 3642203280 ISBN 13 : 9783642203282

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Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne

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Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education. Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy. 360 pp. Englisch. N� de r�f. du vendeur 9783642203282

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Atomic Force Microscopy Based Nanorobotics

Hui Xie|Cagdas Onal|St�phane R�gnier|Metin Sitti

Edit� par Springer Berlin Heidelberg, 2011

ISBN 10 : 3642203280 ISBN 13 : 9783642203282

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Gebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents new ideas for three-dimensional and high-efficiency parallel nanomanipulation using newly developed nanorobots based on the principle of atomic force microscopy Clearly written and well-organized, this text introduces designs and prototyp. N� de r�f. du vendeur 5052174

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Atomic Force Microscopy Based Nanorobotics

Hui Xie

Edit� par Springer, Springer Sep 2011, 2011

ISBN 10 : 3642203280 ISBN 13 : 9783642203282

Neuf Couverture rigide

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Buch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education.Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 360 pp. Englisch. N� de r�f. du vendeur 9783642203282

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Atomic Force Microscopy Based Nanorobotics : Modelling, Simulation, Setup Building and Experiments

Hui Xie

Edit� par Springer, Springer Spektrum, 2011

ISBN 10 : 3642203280 ISBN 13 : 9783642203282

Neuf Couverture rigide

Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne

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Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education. Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy. N� de r�f. du vendeur 9783642203282

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Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments

Xie, Hui/ Onal, Cagdas/ Regnier, Stephane/ Sitti, Metin

Edit� par Springer Verlag, 2011

ISBN 10 : 3642203280 ISBN 13 : 9783642203282

Neuf Couverture rigide

Vendeur : Revaluation Books, Exeter, Royaume-Uni

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Hardcover. Etat : Brand New. 2011 edition. 360 pages. 9.00x6.25x0.75 inches. In Stock. N� de r�f. du vendeur x-3642203280

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