Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces - Couverture souple

Couverture souple

ISBN 10 : 3642271138 ISBN 13 : 9783642271137

Editeur : Springer, 2013

Synopsis

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

A propos du livre

Présentation de l'éditeur

This volume presents a concise introduction to Kelvin probe force microscopy. The text discusses potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.

Détails de l'édition

• Éditeur: Springer
• Date d'édition: 2013
• Langue: anglais
• ISBN 10: 3642271138
• ISBN 13: 9783642271137
• Reliure: Broché
• Nombre de pages: 348
• Éditeur: Sadewasser Sascha, Glatzel Thilo
• Coordonnées du fabricant: ProductSafety@springernature.com; ProductSafety@springernature.com; ; Poststr. 9; Darmstadt; 64293; Allemagne