Transmission Electron Microscopy and Diffractometry of Materials - Couverture rigide

Fultz, Brent; Howe, James

$9783642297601: Transmission Electron Microscopy and Diffractometry of Materials$

Couverture rigide

ISBN 10 : 3642297609 ISBN 13 : 9783642297601

Editeur : Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 2012

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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Les informations fournies dans la section � Synopsis � peuvent faire r�f�rence � une autre �dition de ce titre.

� propos de l?auteur

Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on Transmission Electron Microscopy and Diffractometry of Materials.

James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.

Les informations fournies dans la section � A propos du livre � peuvent faire r�f�rence � une autre �dition de ce titre.

�diteur: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Date d'�dition: 2012
Langue: anglais
ISBN 10: 3642297609
ISBN 13: 9783642297601
Reliure: Reli�
Num�ro d'�dition: 4
Nombre de pages: 764
Coordonn�es du fabricant: non disponible
Personne responsable: CMN Printpool Inh. Mathis Neumann
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Transmission Electron Microscopy and Diffractometry of Materials

Brent Fultz|James Howe

Edit� par Springer Berlin Heidelberg, 2012

ISBN 10 : 3642297609 ISBN 13 : 9783642297601

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Gebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching . N� de r�f. du vendeur 5056013

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Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)

Fultz, Brent; Howe, James

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ISBN 10 : 3642297609 ISBN 13 : 9783642297601

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Transmission Electron Microscopy and Diffractometry of Materials

James Howe

Edit� par Springer Berlin Heidelberg, 2012

ISBN 10 : 3642297609 ISBN 13 : 9783642297601

Neuf Couverture rigide

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Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. N� de r�f. du vendeur 9783642297601

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Transmission Electron Microscopy and Diffractometry of Materials

James Howe

Edit� par Springer Berlin Heidelberg Okt 2012, 2012

ISBN 10 : 3642297609 ISBN 13 : 9783642297601

Neuf Couverture rigide

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Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne

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Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. 784 pp. Englisch. N� de r�f. du vendeur 9783642297601

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Transmission Electron Microscopy and Diffractometry of Materials

James Howe

Edit� par Springer Berlin Heidelberg, Springer Berlin Heidelberg Okt 2012, 2012

ISBN 10 : 3642297609 ISBN 13 : 9783642297601

Neuf Couverture rigide

Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne

�valuation du vendeur 5 sur 5 �toiles

Buch. Etat : Neu. Neuware -This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 784 pp. Englisch. N� de r�f. du vendeur 9783642297601

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