Ellipsometry of Functional Organic Surfaces and Films - Couverture rigide

Couverture rigide

ISBN 10 : 3642401279 ISBN 13 : 9783642401275

Editeur : Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 2013

Synopsis

Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.

A propos du livre

Présentation de l'éditeur

This book provides a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces.

Détails de l'édition

• Éditeur: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
• Date d'édition: 2013
• Langue: anglais
• ISBN 10: 3642401279
• ISBN 13: 9783642401275
• Reliure: Relié
• Nombre de pages: 363
• Éditeur: Hinrichs Karsten, Eichhorn Klaus-Jochen
• Coordonnées du fabricant: non disponible
• Personne responsable: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Allemagne