Articles liés à Auger- and X-Ray Photoelectron Spectroscopy in Materials...
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - Couverture souple
Synopsis
This book deals with an important surface analytical technique. It gives a textbook-like introduction to the basics, information on instrumentals and an introduction to applications and problem-solving. It is a must for all researchers and advanced students in this field.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Résultats de recherche pour Auger- and X-Ray Photoelectron Spectroscopy in Materials...
Image d'archives
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science (eng)
impression à la demandeVendeur : Brook Bookstore On Demand, Napoli, NA, Italie
Évaluation du vendeur 5 sur 5 étoiles
Etat : new. Questo è un articolo print on demand. N° de réf. du vendeur MCJ7D93PXT
Acheter neuf
EUR 246,33
Expédition à EUR 8
Expédition depuis Italie vers Etats-Unis
Expédition depuis Italie vers Etats-Unis
Quantité disponible : Plus de 20 disponibles
Image fournie par le vendeur
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Edité par
Springer Berlin Heidelberg, 2014
ISBN 10 : 3642431739
ISBN 13 : 9783642431739
Neuf
Couverture souple
Vendeur : moluna, Greven, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This is the most comprehensive book available on this widely used analytical techniqueTo anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typica. N° de réf. du vendeur 5060623
Acheter neuf
EUR 267,86
Expédition à EUR 48,99
Expédition depuis Allemagne vers Etats-Unis
Expédition depuis Allemagne vers Etats-Unis
Quantité disponible : Plus de 20 disponibles
Image d'archives
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49)
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. In. N° de réf. du vendeur ria9783642431739_new
Acheter neuf
EUR 313,32
Expédition à EUR 13,98
Expédition depuis Royaume-Uni vers Etats-Unis
Expédition depuis Royaume-Uni vers Etats-Unis
Quantité disponible : Plus de 20 disponibles
Image fournie par le vendeur
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Edité par
Springer Berlin Heidelberg Nov 2014, 2014
ISBN 10 : 3642431739
ISBN 13 : 9783642431739
Neuf
Taschenbuch
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented. 548 pp. Englisch. N° de réf. du vendeur 9783642431739
Acheter neuf
EUR 320,99
Expédition à EUR 23
Expédition depuis Allemagne vers Etats-Unis
Expédition depuis Allemagne vers Etats-Unis
Quantité disponible : 2 disponible(s)
Image fournie par le vendeur
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science | A User-Oriented Guide
Vendeur : preigu, Osnabrück, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. Auger- and X-Ray Photoelectron Spectroscopy in Materials Science | A User-Oriented Guide | Siegfried Hofmann | Taschenbuch | Springer Series in Surface Sciences | xx | Englisch | 2014 | Springer | EAN 9783642431739 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. N° de réf. du vendeur 105023488
Acheter neuf
EUR 274,60
Expédition à EUR 70
Expédition depuis Allemagne vers Etats-Unis
Expédition depuis Allemagne vers Etats-Unis
Quantité disponible : 5 disponible(s)
Image fournie par le vendeur
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Edité par
Springer, Springer Nov 2014, 2014
ISBN 10 : 3642431739
ISBN 13 : 9783642431739
Neuf
Taschenbuch
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book deals with an important surface analytical technique. It gives a textbook-like introduction to the basics, information on instrumentals and an introduction to applications and problem-solving. It is a must for all researchers and advanced students in this field.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 548 pp. Englisch. N° de réf. du vendeur 9783642431739
Acheter neuf
EUR 320,99
Expédition à EUR 60
Expédition depuis Allemagne vers Etats-Unis
Expédition depuis Allemagne vers Etats-Unis
Quantité disponible : 1 disponible(s)
Image fournie par le vendeur
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science : A User-Oriented Guide
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented. N° de réf. du vendeur 9783642431739
Acheter neuf
EUR 331,86
Expédition à EUR 64,10
Expédition depuis Allemagne vers Etats-Unis
Expédition depuis Allemagne vers Etats-Unis
Quantité disponible : 1 disponible(s)
Image d'archives
Auger- and X-ray Photoelectron Spectroscopy in Materials Science: A User-oriented Guide
Vendeur : Revaluation Books, Exeter, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
Paperback. Etat : Brand New. 2013 edition. 550 pages. 9.25x6.10x1.30 inches. In Stock. N° de réf. du vendeur x-3642431739
Acheter neuf
EUR 450,21
Expédition à EUR 14,58
Expédition depuis Royaume-Uni vers Etats-Unis
Expédition depuis Royaume-Uni vers Etats-Unis
Quantité disponible : 2 disponible(s)