Transmission Electron Microscopy and Diffractometry of Materials - Couverture souple

Livre 38 sur 126: Graduate Texts in Physics

Fultz, Brent; Howe, James

 
9783642433153: Transmission Electron Microscopy and Diffractometry of Materials
Couverture souple
ISBN 10 : 3642433154 ISBN 13 : 9783642433153
Editeur : Springer, 2014

Synopsis

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

À propos de l?auteur

Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on Transmission Electron Microscopy and Diffractometry of Materials.

James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Springer
Date d'édition
2014
Langue
anglais
ISBN 10 
3642433154
ISBN 13 
9783642433153
Reliure
Broché
Numéro d'édition
4
Nombre de pages
784
Coordonnées du fabricant
ProductSafety@springernature.com
ProductSafety@springernature.com

Poststr. 9
Darmstadt
64293
Allemagne

Autres éditions populaires du même titre

9783642297601: Transmission Electron Microscopy and Diffractometry of Materials

Edition présentée

ISBN 10 :  3642297609 ISBN 13 :  9783642297601
Editeur : Springer-Verlag Berlin and Heide..., 2012
Couverture rigide