Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Couverture souple

Xie, Hui; Onal, Cagdas; R�gnier, St�phane; Sitti, Metin

9783642445019: Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments

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ISBN 10 : 3642445012 ISBN 13 : 9783642445019

Editeur : Springer, 2014

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The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.

There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education.

Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.

Les informations fournies dans la section � Synopsis � peuvent faire r�f�rence � une autre �dition de ce titre.

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This clearly-expressed, well-organized book introduces designs and prototypes of nanorobotic systems in detail, examining innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.

Les informations fournies dans la section � A propos du livre � peuvent faire r�f�rence � une autre �dition de ce titre.

�diteurSpringer
Date d'�dition2014
ISBN 10 3642445012
ISBN 13 9783642445019
ReliureBroch�
Langueanglais
Nombre de pages360

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9783642203282: Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments

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ISBN 10 : 3642203280 ISBN 13 : 9783642203282
Editeur : Springer-Verlag Berlin and Heide..., 2011
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Atomic Force Microscopy Based Nanorobotics

Hui Xie|Cagdas Onal|St�phane R�gnier|Metin Sitti

Edit� par Springer Berlin Heidelberg, 2014

ISBN 10 : 3642445012 ISBN 13 : 9783642445019

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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents new ideas for three-dimensional and high-efficiency parallel nanomanipulation using newly developed nanorobots based on the principle of atomic force microscopy Clearly written and well-organized, this text introduces designs and prototyp. N� de r�f. du vendeur 11801121

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Atomic Force Microscopy Based Nanorobotics : Modelling, Simulation, Setup Building and Experiments

Hui Xie

Edit� par Springer Berlin Heidelberg, 2014

ISBN 10 : 3642445012 ISBN 13 : 9783642445019

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Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education. Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy. N� de r�f. du vendeur 9783642445019

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Atomic Force Microscopy Based Nanorobotics

Hui Xie

Edit� par Springer Berlin Heidelberg Nov 2014, 2014

ISBN 10 : 3642445012 ISBN 13 : 9783642445019

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Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne

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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education. Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy. 360 pp. Englisch. N� de r�f. du vendeur 9783642445019

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