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Synopsis
The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.
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In-situ Materials Characterization. Across Spatial and Temporal Scales.
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Heidelberg, Springer., 2014
ISBN 10 : 3642451519
ISBN 13 : 9783642451515
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25 cm. XI, 256 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Springer Series in Materials Science, Vol. 193. Sprache: Englisch. N° de réf. du vendeur 9587DB
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In-situ Materials Characterization: Across Spatial and Temporal Scales (Springer Series in Materials Science, 193)
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In-situ Materials Characterization: Across Spatial and Temporal Scales (Springer Series in Materials Science, 193)
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IN SITU MATERIALS CHARACTERIZATION VOL 193 (HB 2014)
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IN SITU MATERIALS CHARACTERIZATION VOL 193 (HB 2014)
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In-situ Materials Characterization: Across Spatial and Temporal Scales (Springer Series in Materials Science, 193)
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IN SITU MATERIALS CHARACTERIZATION VOL 193 (HB 2014)
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In-situ Materials Characterization
Edité par
Springer Berlin Heidelberg Apr 2014, 2014
ISBN 10 : 3642451519
ISBN 13 : 9783642451515
Neuf
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Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
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Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction. 268 pp. Englisch. N° de réf. du vendeur 9783642451515
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In-situ Materials Characterization: Across Spatial and Temporal Scales (Springer Series in Materials Science, 193)
Vendeur : ALLBOOKS1, Direk, SA, Australie
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In-situ Materials Characterization
Edité par
Springer Berlin Heidelberg, 2014
ISBN 10 : 3642451519
ISBN 13 : 9783642451515
Neuf
Couverture rigide
Vendeur : moluna, Greven, Allemagne
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Scientific status report on analytical techniques in nano-and surface sciencesPresentation of the basics and applications of various surface and thin film analytical -techniques: Scanning Probe Microscopy, X-ray diffraction at synchrotron, Free-El. N° de réf. du vendeur 5061555
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