X-ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, W�rzburg, August 19-23, 1996 - Couverture souple

9783642721083: X-ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, W�rzburg, August 19-23, 1996

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ISBN 10 : 3642721087 ISBN 13 : 9783642721083

Editeur : Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 2014

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This book appeals to reseachers developing and/or using the new and important technique of X-ray microscopy. The subject is treated systematically in the book, which gives a status report on this analytical technique. The variety of applications is presented on the enclosed CD.

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�diteur: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Date d'�dition: 2014
Langue: anglais
ISBN 10: 3642721087
ISBN 13: 9783642721083
Reliure: Broch�
Nombre de pages: 402
�diteur: Thieme J�rgen, Schmahl G�nter, Rudolph Dietbert, Umbach Eberhard
Coordonn�es du fabricant: Springer-Verlag GmbH
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9783540639985: X-RAY MICROSCOPY AND SPECTROMICROSCOPY

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ISBN 10 : 3540639985 ISBN 13 : 9783540639985
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Thieme, J�rgen

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X-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, W�rzburg, August 19-23, 1996

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X-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Wurzburg, August 19 23, 1996

Jurgen Thieme, Gunter Schmahl, Dietbert Rudolph

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X-Ray Microscopy and Spectromicroscopy

J�rgen Thieme

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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book is based on presentations to the International Conference of X-Ray Micro scopy and Spectromicroscopy, XRM 96, which took place in Wiirzburg, August 19- 23, 1996. The conference also celebrated the lOOth anniversary of the discovery of X rays by Wilhelm Conrad Rontgen on November 8, 1895, in Wiirzburg. This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities within a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. Their variety demonstrates the interdisci plinary and cooperative character of this field and the growing demand for micro scopic and spectromicroscopic information on the nanometer scale and under specific sample conditions, for example in wet (natural) surroundings or on a solid surface. 408 pp. Englisch. N� de r�f. du vendeur 9783642721083

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X-ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, W�rzburg, August 19-23, 1996

Thieme, J�rgen (Editor)/ Schmahl, G�nter (Editor)/ Rudolph, Dietbert (Editor)/ Umbach, Eberhard (Editor)

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X-Ray Microscopy and Spectromicroscopy

J�rgen Thieme

Edit� par Springer Berlin Heidelberg, Springer Berlin Heidelberg Aug 2014, 2014

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Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book is based on presentations to the International Conference of X-Ray Micro scopy and Spectromicroscopy, XRM 96, which took place in Wiirzburg, August 19- 23, 1996. The conference also celebrated the lOOth anniversary of the discovery of X rays by Wilhelm Conrad Rontgen on November 8, 1895, in Wiirzburg. This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities within a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. Their variety demonstrates the interdisci plinary and cooperative character of this field and the growing demand for micro scopic and spectromicroscopic information on the nanometer scale and under specific sample conditions, for example in wet (natural) surroundings or on a solid surface.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 408 pp. Englisch. N� de r�f. du vendeur 9783642721083

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X-Ray Microscopy and Spectromicroscopy : Status Report from the Fifth International Conference, W�rzburg, August 19�23, 1996

J�rgen Thieme

Edit� par Springer Berlin Heidelberg, 2014

ISBN 10 : 3642721087 ISBN 13 : 9783642721083

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Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book is based on presentations to the International Conference of X-Ray Micro scopy and Spectromicroscopy, XRM 96, which took place in Wiirzburg, August 19- 23, 1996. The conference also celebrated the lOOth anniversary of the discovery of X rays by Wilhelm Conrad Rontgen on November 8, 1895, in Wiirzburg. This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities within a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. Their variety demonstrates the interdisci plinary and cooperative character of this field and the growing demand for micro scopic and spectromicroscopic information on the nanometer scale and under specific sample conditions, for example in wet (natural) surroundings or on a solid surface. N� de r�f. du vendeur 9783642721083

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X-Ray Microscopy and Spectromicroscopy | Status Report from the Fifth International Conference, W�rzburg, August 19-23, 1996

J�rgen Thieme (u. a.)

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X-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, W�rzburg, August 1923, 1996

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X-Ray Microscopy and Spectromicroscopy : Status Report from the Fifth International Conference, W�rzburg, August 19�23, 1996

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ISBN 10 : 3642721087 ISBN 13 : 9783642721083

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Etat : Sehr gut. Zustand: Sehr gut | Seiten: 408 | Sprache: Englisch | Produktart: B�cher | This book is based on presentations to the International Conference of X-Ray Micro� scopy and Spectromicroscopy, XRM 96, which took place in Wiirzburg, August 19- 23, 1996. The conference also celebrated the lOOth anniversary of the discovery of X� rays by Wilhelm Conrad Rontgen on November 8, 1895, in Wiirzburg. This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities within a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. Their variety demonstrates the interdisci� plinary and cooperative character of this field and the growing demand for micro� scopic and spectromicroscopic information on the nanometer scale and under specific sample conditions, for example in wet (natural) surroundings or on a solid surface. N� de r�f. du vendeur 25054184/2

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