Structural Analysis of Point Defects in Solids provides a comprehensive introduction to the principles and techiques of modern electron paramagnetic resonance spectroscopy applied to the determination of microscopic defect structures. It informs the nonspecialist about the potential of the different methods, while the researcher faced with the task of determining defect structures will find here the necessary tools. The book will be useful for materials scientists working in semiconductor physics, laser physics, radiation damage, etc., and also for mineralogists and solid state chemists.
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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Strutural Analysis of Point Defects in Solids introduces theprinciples and techniques of modern electron paramagneticresonance (EPR) spectroscopy essentialfor applications tothe determination of microscopic defectstructures. Investigations of the microscopic and electronicstructure, and also correlations with themagnetic propertiesof solids, require various multiplemagnetic resonance methods, such as ENDOR and opticallydetected EPR or ENDOR. This book discusses experimental,technological and theoretical aspects of these techniquescomprehensively, from a practical viewpoint, with manyillustrative examples taken from semiconductors and othersolids. The nonspecialist is informed about the potential ofthe different methods, while the researcher faced with thetask of determining defect structures isprovided with thenecessary tools, together with much information oncomputer-aided methods of data analysis and the principlesof modern spectrometer design. 384 pp. Englisch. N° de réf. du vendeur 9783642844072
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Strutural Analysis of Point Defects in Solids introduces theprinciples and techniques of modern electron paramagneticresonance (EPR) spectroscopy essentialfor applications tothe determination of microscopic defectstructures. Investigations. N° de réf. du vendeur 5072082
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Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -Strutural Analysis of Point Defects in Solids introduces theprinciples and techniques of modern electron paramagneticresonance (EPR) spectroscopy essentialfor applications tothe determination of microscopic defectstructures. Investigations of the microscopic and electronicstructure, and also correlations with themagnetic propertiesof solids, require various multiplemagnetic resonance methods, such as ENDOR and opticallydetected EPR or ENDOR. This book discusses experimentaltechnological and theoretical aspects of these techniquescomprehensively, from a practical viewpoint, with manyillustrative examples taken from semiconductors and othersolids. The nonspecialist is informed about the potential ofthe different methods, while the researcher faced with thetask of determining defect structures isprovided with thenecessary tools, together with much information oncomputer-aided methods of data analysis and the principlesof modern spectrometer design.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 384 pp. Englisch. N° de réf. du vendeur 9783642844072
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Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Strutural Analysis of Point Defects in Solids introduces theprinciples and techniques of modern electron paramagneticresonance (EPR) spectroscopy essentialfor applications tothe determination of microscopic defectstructures. Investigations of the microscopic and electronicstructure, and also correlations with themagnetic propertiesof solids, require various multiplemagnetic resonance methods, such as ENDOR and opticallydetected EPR or ENDOR. This book discusses experimental,technological and theoretical aspects of these techniquescomprehensively, from a practical viewpoint, with manyillustrative examples taken from semiconductors and othersolids. The nonspecialist is informed about the potential ofthe different methods, while the researcher faced with thetask of determining defect structures isprovided with thenecessary tools, together with much information oncomputer-aided methods of data analysis and the principlesof modern spectrometer design. N° de réf. du vendeur 9783642844072
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Taschenbuch. Etat : Neu. Structural Analysis of Point Defects in Solids | An Introduction to Multiple Magnetic Resonance Spectroscopy | Johann-Martin Spaeth (u. a.) | Taschenbuch | XI | Englisch | 2012 | Springer | EAN 9783642844072 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. N° de réf. du vendeur 106331093
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