Data-Driven Fault Detection for Industrial Processes: Canonical Correlation Analysis and Projection Based Methods - Couverture souple

Chen, Zhiwen

Couverture souple

ISBN 10 : 3658167556 ISBN 13 : 9783658167554

Editeur : Springer Vieweg, 2017

Synopsis

Zhiwen Chen aims to develop advanced fault detection (FD) methods for the monitoring of industrial processes. With the ever increasing demands on reliability and safety in industrial processes, fault detection has become an important issue. Although the model-based fault detection theory has been well studied in the past decades, its applications are limited to large-scale industrial processes because it is difficult to build accurate models. Furthermore, motivated by the limitations of existing data-driven FD methods, novel canonical correlation analysis (CCA) and projection-based methods are proposed from the perspectives of process input and output data, less engineering effort and wide application scope. For performance evaluation of FD methods, a new index is also developed.

A propos du livre

À propos de l'auteur

Zhiwen Chen's research interests include multivariate statistical process monitoring, model-based and data-driven fault diagnosis as well as their application to industrial processes. He is currently working at the School of Information Science and Engineering at Central South University, China.

Détails de l'édition

• Éditeur: Springer Vieweg
• Date d'édition: 2017
• Langue: anglais
• ISBN 10: 3658167556
• ISBN 13: 9783658167554
• Reliure: Broché
• Numéro d'édition: 1
• Nombre de pages: 132
• Coordonnées du fabricant: non disponible
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